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参数资料
| 型号： | PS12017-A |
| 元件分类： | 运动控制电子 |
| 英文描述： | AC MOTOR CONTROLLER, 50 A, UFM36 |
| 文件页数： | 5/6页 |
| 文件大小： | 397K |
| 代理商： | PS12017-A |
MITSUBISHI SEMICONDUCTOR <Application Specific Intelligent Power Module>
PS12017-A
FLAT-BASE TYPE
INSULATED TYPE
Jan. 2000
PRELIMINARY
Notice:
This
is not
a final
specification.
Some
parametric
limits
are subject
to change.
200
–200
Analogue output signal
data hold range
1
2
3
4
5
400
300
100
0
–100
–300
–400
0
VC+(200%)
VC0
VC
–(200%)
V
C
(V)
VC+
VC–
min
max
Real load current peak value.(%)(Ic=Io! 2)
VDH=15V
VDL=5V
TC=
–20~100C
Note : Input interlock protection circuit ; It is operated when the input signals for any upper-arm / lower-arm pair of a phase are simulta-
neously in “LOW” level.
By this interlocking, both upper and lower IGBTs of this mal-triggered phase are cut off, and “FO” signal is outputted. After an “input
interlock” operation the circuit is latched. The “FO” is reset by the high-to-low going edge of either an upper-leg, or a lower-leg input,
whichever comes in later.
0V
Input signal VCIN(p) of each phase upper arm
Input signal VCIN(n) of each phase lower arm
Gate signal Vo(p) of each phase upper arm
(ASIPM internal)
Gate signal Vo(n) of each phase upper arm
(ASIPM internal)
Error output FO1
Note : Shor t circuit protection operation. The protection operates with “FO” flag and reset on a pulse-by-pulse scheme. The protection by
gate shutdown is given only to the IGBT that senses an overload (excluding the IGBT for the “Brake”).
SC delay time
Short circuit sensing signal VS
Error output FO1
Gate signal Vo of each phase
upper arm(ASIPM internal)
Input signal VCIN of each phase
upper arm
0V
Fig. 4 OUTPUT CURRENT ANALOGUE SIGNALING
LINEARITY
Fig. 5 OUTPUT CURRENT ANALOGUE SIGNALING
“DATA HOLD” DEFINITION
Fig. 7 TIMING CHART AND SHORT CIRCUIT PROTECTION OPERATION
Fig. 6 INPUT INTERLOCK OPERATION TIMING CHART
VCH(5
s)
VCH(505
s)
0V
VC
500
s
rCH=
VCH(505
s)-VCH(5s)
VCH(5
s)
Note ; Ringing happens around the point where the signal output
voltage changes state from “analogue” to “data hold” due
to test circuit arrangement and instrumentational trouble.
Therefore, the rate of change is measured at a 5
s delayed point.
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