参数资料
型号: RA06H8285M-E01
厂商: Electronic Theatre Controls, Inc.
英文描述: MITSUBISHI RF MOSFET MODULE
中文描述: 三菱射频MOSFET模块
文件页数: 8/8页
文件大小: 66K
代理商: RA06H8285M-E01
MITSUBISHI RF POWER MODULE
R A06H8285M
RA06H8285M
MITSUBISHI ELECTRIC
8/9
23 Dec 2002
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
Output Power Control:
Depending on linearity, the following two methods are recommended to control the output power:
a) Non-linear FM modulation:
By the gate voltage (V
GG
).
When the gate voltage is close to zero, the RF input signal is attenuated up to 60 dB and only a small leakage
current flows from the battery into the drain.
Around V
GG
=4V, the output power and drain current increases substantially.
Around V
GG
=4.5V (typical) to V
GG
=5V (maximum), the nominal output power becomes available.
b) Linear AM modulation:
By RF input power P
in
.
The gate voltage is used to set the drain’s quiescent current for the required linearity.
Oscillation:
To test RF characteristics, this module is put on a fixture with two bias decoupling capacitors each on gate and drain,
a 4.700 pF chip capacitor, located close to the module, and a 22 μF (or more) electrolytic capacitor.
When an amplifier circuit around this module shows oscillation, the following may be checked:
a) Do the bias decoupling capacitors have a low inductance pass to the case of the module
b) Is the load impedance Z
L
=50
c) Is the source impedance Z
G
=50
Frequent on/off switching:
In base stations, frequent on/off switching can cause thermal expansion of the resin that coats the transistor chips
and can result in reduced or no output power. The bond wires in the resin will break after long-term thermally induced
mechanical stress.
Quality:
Mitsubishi Electric is not liable for failures resulting from base station operation time or operating conditions
exceeding those of mobile radios.
This module technology results from more than 20 years of experience, field proven in tens of millions of mobile
radios. Currently, most returned modules show failures such as ESD, substrate crack, and transistor burnout, which
are caused by improper handling or exceeding recommended operating conditions. Few degradation failures are
found.
Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but
there is always the possibility that trouble may occur. Trouble with semiconductors may lead to personal injury, fire or property
damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as
(i) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material, or (iii) prevention against any malfunction or
mishap.
Keep safety first in your circuit designs!
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