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| 型号： | RC0201-R-SKE24L |
| 厂商： | Yageo |
| 文件页数： | 14/16页 |
| 文件大小： | 0K |
| 描述： | RES KIT 0201 |
| 标准包装： | 1 |
| 系列： | RC0201 |
| 套件类型： | 1/20W（.05W）1%、5% 厚膜 |
| 安装类型： | 表面贴装 |
| 包括封装： | 0201（0603 公制） |
| 工具箱内容： | (100) 311-68KNCT-ND - RES 68K OHM 1/20W 5% 0201 SMD (100) 311-680NCT-ND - RES 680 OHM 1/20W 5% 0201 SMD (100) 311-5.6KNCT-ND - RES 5.6K OHM 1/20W 5% 0201 SMD (100) 311-560NCT-ND - RES 560 OHM 1/20W 5% 0201 SMD (100) 311-51NCT-ND - RES 51 OHM 1/20W 5% 0201 SMD (100) 311-51KNCT-ND - RES 51K OHM 1/20W 5% 0201 SMD (100) 311-4.7KNCT-ND - RES 4.7K OHM 1/20W 5% 0201 SMD (100) 311-47NCT-ND - RES 47 OHM 1/20W 5% 0201 SMD (100) 311-47KNCT-ND - RES 47K OHM 1/20W 5% 0201 SMD (100) 311-470NCT-ND - RES 470 OHM 1/20W 5% 0201 SMD 更多... |
| 其它名称： | Q4761638 |
Product specification
14
Chip Resistor Surface Mount
Thick film technology
INTRODUCTION
16
TESTS AND PROCEDURES
To guarantee zero defect production standard, Statistical Process Control is an essential part of our production
processes. Furthermore, our production process is operating in accordance with “ISO 9000” .
Essentially all tests on resistors are carried out in accordance with the schedule of “IEC publication 60115-1” in
the specified climatic category and in accordance with “IEC publication 60068” , “MIL-STD” , “JIS C 5202” , and “EIA/IS” ,
etc. In some instances deviations from the IEC recommendations are made.
Tests and their requirements are described in detail in the data sheets.
Size 1206
Size 1206
TC
/K) 200
Δ R
0.8
300
handbook, halfpage
6
(10
spec. level
MGA210
1.2
handbook, halfpage
R
(%)
spec. level
MGA214
100
0
100
0.4
0
0.4
200
spec. level
0.8
spec. level
300
1
10
100
1k
10 k
100 k
1M
10 M
1.2
1
10
100
1k
10 k
100 k
1M
10 M
R ( Ω )
Fig. 16 Typical temperature coefficients between the lower
and upper category temperatures
Size 1206
R ( Ω )
Fig. 17 Typical percentage change in resistance after soldering
for 10 seconds at 270 °C, completely immersed
Size 1206
noise
Δ R
12
handbook, halfpage
level
MGA213
handbook, halfpage
2
R
MGA216
μ V
V
8
(%)
1
spec. level
spec. level
0
4
1
2
spec. level
0
100
1k
10 k
100 k
1M
1
10
100
1k
10 k
100 k
1M
10 M
R ( Ω )
Fig. 18 Typical noise level as a function of rated resistance
measured using Quantech - equipment
R ( Ω )
Fig. 19 Typical percentage change in resistance after 56 days
at 40 °C and 90 to 95% relative humidity loaded with
P nom
www.yageo.com
Mar 25, 2008 V.7
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