参数资料
型号: RDHA710SE10A2QK
元件分类: 继电器,输入/输出模块
英文描述: TRANSISTOR OUTPUT SOLID STATE RELAY, 1000 V ISOLATION-MAX
封装: HERMETICALLY SEALED, SURFACE MOUNT PACKAGE-8
文件页数: 3/6页
文件大小: 116K
代理商: RDHA710SE10A2QK
www.irf.com
3
RDHA710SE10A2QK
Notes for Maximum Ratings, Electrical and General Characteristic Tables
Specification is guaranteed by design
Rise and fall times are controlled internally
Inputs protected for V
IN< 1.0V and VIN > 7.5V
m Optically coupled Solid State Relays (SSRs) have relatively slow turn on and turn off times. Care must be taken to
insure that transient currents do not cause violation of SOA. If transient conditions are present, IR recommends a
complete simulation to be performed by the end user to insure compliance with SOA requirements as specified in the
IRHNJ57130 data sheet
n While the SSR design meets the design requirements specified in MIL-PRF-38534, the end user is responsible for
product derating, as required for the application
o Reference Figures 3 & 4 for Switching Test Circuits and Wave Form
Input Supply voltage shall not exceed 5.25V@Tc 70°C
Total Dose Irradiation with Input Bias. 10mA I
DD applied and VDS = 0 during Irradiation
Total Dose Irradiation with Output Bias. 80 Volts V
DS applied and IDD = 0 during Irradiation
Post Total Dose Irradiation ,,
Electrical Characteristics per Channel @ 25°C (Unless Otherwise Specified)
Parameter
Group A
Test Conditions
Symbol Min. Typ. Max. Units
Subgroups
Output On-Resistance
1
VIN = 5.0V, VDD = 5.0V, IO= 10A RDS(ON)
--
0.070 0.100
Output Leakage Current
1
VIN = 0.8V, VS = 100V
IO
--
25
Input Buffer Current
1
VIN = 5.0V
IIN
--
1.0
VIN =5.0V, VDD =5.0V, VS =30V
RC = 7.0
/100F, PW = 50ms
VIN =0.8V, VDD =5.0V, VS =30V
RC = 7.0
/100F, PW = 50ms
VIN =5.0V, VDD =5.0V, VS =30V
RC = 7.0
/100F, PW = 50ms
VIN =0.8V, VDD =5.0V, VS =30V
RC = 7.0
/100F, PW = 50ms
ton
10
toff
--
tr
Fall Time
dh
tf
--
6.0
1
A
1
Turn-On Delay
h
1
Turn-Off Delay
h
ms
--
6.5
26
25
50
Rise Time
dh
1--
1.3
5.5
International Rectifier does not currently have a DSCC certified Radiation Hardness Assurance Program
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