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参数资料
| 型号： | REF3333AIDCKT |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 基准电压源/电流源 |
| 英文描述： | 1-OUTPUT THREE TERM VOLTAGE REFERENCE, 3.3 V, PDSO3 |
| 封装： | GREEN, SC-70, 3 PIN |
| 文件页数： | 12/20页 |
| 文件大小： | 580K |
| 代理商： | REF3333AIDCKT |
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
PIN CONFIGURATION
1
IN
2
OUT
3
GND
SBOS392A – AUGUST 2007 – REVISED SEPTEMBER 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
PACKAGE
PRODUCT
DESCRIPTION
PACKAGE
DESIGNATOR
PACKAGE MARKING
SOT23-3
DBZ
R33A
REF3312
1.25V
SC70-3
DCK
R12
SOT23-3
DBZ
R33B
REF3318
1.8V
SC70-3
DCK
R18
SOT23-3
DBZ
R33C
REF3320
2.048V
SC70-3
DCK
R20
SOT23-3
DBZ
R33D
REF3325
2.5V
SC70-3
DCK
R25
SOT23-3
DBZ
R33E
REF3330
3.0V
SC70-3
DCK
R30
SOT23-3
DBZ
R33F
REF3333
3.3V
SC70-3
DCK
R33
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
VALUE
UNIT
Input Voltage (VIN)
+7.5
V
Output Short-Circuit (ISC)
180
mA
Output Voltage (OUT pin)(2)
5
V
Operating Temperature
–50 to +150
°C
Storage Temperature
–65 to +150
°C
Junction Temperature (TJ)
+150
°C
Human Body Model (HBM)
4000
V
ESD Ratings
Charged Device Model (CDM)
1000
V
Machine Model (MM)
200
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
REF3312, REF3318, REF3320, REF3325, REF3330, REF3333
SOT23-3, SC70-3
TOP VIEW
2
Copyright 2007, Texas Instruments Incorporated
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