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| 型号： | S71WS512N80BAEZZ3 |
| 厂商： | Spansion Inc. |
| 英文描述： | Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| 中文描述： | 堆叠式多芯片产品（MCP）的闪存和移动存储芯片的CMOS 1.8伏特 |
| 文件页数： | 4/142页 |
| 文件大小： | 1996K |
| 代理商： | S71WS512N80BAEZZ3 |
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4
S71WS512NE0BFWZZ_00_A1 June 28, 2004
A d v a n c e I n f o r m a t i o n
Chip Erase Command Sequence ...................................................................58
Sector Erase Command Sequence .................................................................59
Erase Suspend/Erase Resume Commands ..................................................60
Figure 4. Erase Operation.................................................... 61
Program Suspend/Program Resume Commands ...................................... 61
Lock Register Command Set Definitions ...................................................62
Password Protection Command Set Definitions .....................................62
Non-Volatile Sector Protection Command Set Definitions ..................63
Global Volatile Sector Protection Freeze Command Set .....................64
Volatile Sector Protection Command Set ...................................................65
SecSi Sector Entry Command .........................................................................65
Command Definition Summary .....................................................................66
Write Operation Status . . . . . . . . . . . . . . . . . . . . .69
DQ7: Data# Polling ...........................................................................................69
Figure 5. Data# Polling Algorithm......................................... 70
RDY: Ready ..........................................................................................................70
DQ6: Toggle Bit I ...............................................................................................70
Figure 6. Toggle Bit Algorithm.............................................. 71
DQ2: Toggle Bit II ...............................................................................................72
Table 19. DQ6 and DQ2 Indications ..................................... 72
Reading Toggle Bits DQ6/DQ2 ......................................................................72
DQ5: Exceeded Timing Limits ........................................................................73
DQ3: Sector Erase Timer .................................................................................73
DQ1: Write to Buffer Abort ............................................................................73
Table 20. Write Operation Status ......................................... 74
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . .75
Figure 7. Maximum Negative Overshoot Waveform................. 75
Figure 8. Maximum Positive Overshoot Waveform .................. 75
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 75
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . .76
CMOS Compatible .............................................................................................76
Test Conditions ...................................................................................................77
Figure 9. Test Setup........................................................... 77
Table 21. Test Specifications ............................................... 77
Switching Waveforms ........................................................................................77
Table 22. Key to Switching Waveforms ................................. 77
Figure 10. Input Waveforms and Measurement Levels............. 77
V
CC
Power-up .....................................................................................................78
Figure 11. V
CC
Power-up Diagram ........................................ 78
Pin Capacitance ..................................................................................................78
AC Characteristics—Synchronous . . . . . . . . . . . 79
CLK Characterization ........................................................................................79
Figure 12. CLK Characterization ........................................... 79
Synchronous/Burst Read @ V
IO
= 1.8 V .....................................................80
Timing Diagrams ..................................................................................................81
Figure 13. CLK Synchronous Burst Mode Read (rising active CLK).
....................................................................................... 81
Figure 14. Synchronous Burst Mode Read.............................. 82
Figure 15. Eight-word Linear Burst with Wrap Around ............. 82
Figure 16. Eight-word Linear Burst without Wrap Around......... 83
Figure 17. Linear Burst with RDY Set One Cycle Before Data.... 83
AC Characteristics—Asynchronous . . . . . . . . . . 84
Asynchronous Mode Read @ V
IO
pS = 1.8 V .............................................84
Timing Diagrams .................................................................................................84
Figure 18. Asynchronous Mode Read with Latched Addresses... 84
Figure 19. Asynchronous Mode Read..................................... 85
Hardware Reset (RESET#) ..............................................................................85
Figure 20. Reset Timings..................................................... 85
Erase/Program Operations @ V
IO
= 1.8 V .................................................86
Figure 21. Asynchronous Program Operation Timings: WE#
Latched Addresses ............................................................. 87
Figure 22. Synchronous Program Operation Timings: CLK Latched
Addresses......................................................................... 88
Figure 23. Accelerated Unlock Bypass Programming Timing..... 88
Figure 24. Data# Polling Timings (During Embedded Algorithm)...
........................................................................................ 89
Figure 25. Toggle Bit Timings (During Embedded Algorithm)... 89
Figure 26. Synchronous Data Polling Timings/Toggle Bit Timings ..
........................................................................................ 90
Figure 27. DQ2 vs. DQ6 ..................................................... 90
Figure 28. Latency with Boundary Crossing when Frequency > 66
MHz................................................................................. 91
Figure 29. Latency with Boundary Crossing into Program/Erase
Bank................................................................................ 91
Figure 30. Example of Wait States Insertion.......................... 92
Figure 31. Back-to-Back Read/Write Cycle Timings ................ 92
Erase and Programming Performance . . . . . . . . 93
128Mb pSRAM
FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
FUNCTION TRUTH TABLE . . . . . . . . . . . . . . . 95
Asynchronous Operation (Page Mode) .....................................................95
FUNCTION TRUTH TABLE (Continued) . . . . 96
Synchronous Operation (Burst Mode) .......................................................96
STATE DIAGRAM . . . . . . . . . . . . . . . . . . . . . . . . .97
FUNCTIONAL DESCRIPTION . . . . . . . . . . . . . 98
Power-up ...............................................................................................................98
Configuration Register ......................................................................................98
CR Set Sequence ................................................................................................98
FUNCTIONAL DESCRIPTION (Continued) . . 99
Address Key .........................................................................................................99
FUNCTIONAL DESCRIPTION (Continued) . 100
Power Down ......................................................................................................100
FUNCTIONAL DESCRIPTION (Continued) . . 101
Burst Read/Write Operation ..........................................................................101
FUNCTIONAL DESCRIPTION (Continued) . 102
CLK Input Function ..........................................................................................102
ADV# Input Function .......................................................................................102
WAIT# Output Function ................................................................................102
FUNCTIONAL DESCRIPTION (Continued) . . 103
Latency ..................................................................................................................103
FUNCTIONAL DESCRIPTION (Continued) . 104
Address Latch by ADV# .................................................................................104
Burst Length ........................................................................................................104
Single Write .........................................................................................................104
Write Control ....................................................................................................105
FUNCTIONAL DESCRIPTION (Continued) . 106
Burst Read Suspend ..........................................................................................106
Burst Write Suspend ........................................................................................106
FUNCTIONAL DESCRIPTION (Continued) . . 107
Burst Read Termination ..................................................................................107
Burst Write Termination ................................................................................107
ABSOLUTE MAXIMUM RATINGS (See
WARNING below.) . . . . . . . . . . . . . . . . . . . . . . 108
RECOMMENDED OPERATING CONDITIONS
(See WARNING below.) . . . . . . . . . . . . . . . . . . 108
(Referenced to VSS) ...................................................................................108
DC CHARACTERISTICS
. . . . . (Under Recommended Operating Conditions
unless otherwise noted) . . . . . . . . Note *1,*2,*3 109
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| S71WS512N80BAIZZ0 | Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAIZZ2 | Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAIZZ3 | Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
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相关代理商/技术参数 |
参数描述 |
|---|---|
| S71WS512N80BAIZZ0 | 制造商:SPANSION 制造商全称:SPANSION 功能描述:Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAIZZ2 | 制造商:SPANSION 制造商全称:SPANSION 功能描述:Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAIZZ3 | 制造商:SPANSION 制造商全称:SPANSION 功能描述:Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAWZZ0 | 制造商:SPANSION 制造商全称:SPANSION 功能描述:Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
| S71WS512N80BAWZZ2 | 制造商:SPANSION 制造商全称:SPANSION 功能描述:Stacked Multi-Chip Product (MCP) Flash Memory and pSRAM CMOS 1.8 Volt |
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