- 您现在的位置：买卖IC网 > PDF目录98078 > SCAN18374TFMQB (NATIONAL SEMICONDUCTOR CORP) SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 PDF资料下载
参数资料
| 型号： | SCAN18374TFMQB |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | 总线收发器 |
| 英文描述： | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
| 文件页数： | 1/12页 |
| 文件大小： | 24K |
| 代理商： | SCAN18374TFMQB |
Original Creation Date: 10/23/98
Last Update Date: 12/11/98
Last Major Revision Date:
MNSCAN18374T-X REV 1A0
MICROCIRCUIT DATA SHEET
SERIALLY CONTROLLED ACCESS NETWORK D FLIP-FLOP WITH
TRI-STATE OUTPUTS
General Description
The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type
inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control
signals.
This device is compliant with IEEE 1149.1 Standard Test Access Port and
BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic
and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode
Select (TMS), and Test Clock (TCK).
NS Part Numbers
SCAN18374TFMQB
Industry Part Number
SCAN18374T
Prime Die
YJ374
Controlling Document
5962-93207
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
相关PDF资料 |
PDF描述 |
|---|---|
| SCAN18374TMDA | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, UUC56 |
| SCAN18374TFM | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
| SCAN18540TFMQB | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CDFP56 |
| SCAN18540TSSCX | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO56 |
| SCAN18541TFMQB | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SCAN18374TFMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCAN18374TSSC | 功能描述:触发器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 电路数量:2 逻辑系列:SN74 逻辑类型:D-Type Flip-Flop 极性:Inverting, Non-Inverting 输入类型:CMOS 输出类型: 传播延迟时间:4.4 ns 高电平输出电流:- 16 mA 低电平输出电流:16 mA 电源电压-最大:5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:X2SON-8 封装:Reel |
| SCAN18374TSSCX | 功能描述:触发器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 电路数量:2 逻辑系列:SN74 逻辑类型:D-Type Flip-Flop 极性:Inverting, Non-Inverting 输入类型:CMOS 输出类型: 传播延迟时间:4.4 ns 高电平输出电流:- 16 mA 低电平输出电流:16 mA 电源电压-最大:5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:X2SON-8 封装:Reel |
| SCAN1837TSSC | 制造商:FAIRCHILD 制造商全称:Fairchild Semiconductor 功能描述:Transparent Latch with 3-STATE Outputs |
| SCAN18540_YDB3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
发布紧急采购，3分钟左右您将得到回复。