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参数资料
| 型号： | SCAN18374TFMQB |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | 总线收发器 |
| 英文描述： | SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDFP56 |
| 文件页数： | 12/12页 |
| 文件大小： | 24K |
| 代理商： | SCAN18374TFMQB |
MNSCAN18374T-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC Parameters: SCAN TEST OPERATION (Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
CL=50pF, RL=500 OHMS, TRISE/TFALL=3.0ns, Temp. Range: -55 C to 125 C.
NOTE: -55C TEMPERATURE, SUBGROUP
11 IS GUARANTEED BUT NOT TESTED.
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpLZ(4)
Output Disable
Time
VCC=4.5V
During Test Logic Reset
2,
4, 7
TCK to
Data
Out
5.5
19.8
nS
9
2,
4, 7
TCK to
Data
Out
5.5
23.3
nS
10, 11
tpHZ(4)
Output Disable
Time
VCC=4.5V
During Test Logic Reset
2,
4, 7
TCK to
Data
Out
5.0
19.9
nS
9
2,
4, 7
TCK to
Data
Out
5.0
22.9
nS
10, 11
tpZL(2)
Output Enable
Time
VCC=4.5V
During Update-DR state
2,
4, 7
TCK to
Data
Out
6.0
18.9
nS
9
2,
4, 7
TCK to
Data
Out
6.0
22.6
nS
10, 11
tpZH(2)
Output Enable
Time
VCC=4.5V
During Update-DR state
2,
4, 7
TCK to
Data
Out
5.0
16.5
nS
9
2,
4, 7
TCK to
Data
Out
5.0
19.7
nS
10, 11
tpZL(3)
Output Enable
Time
VCC=4.5V
During Update-IR state
2,
4, 7
TCK to
Data
Out
7.0
22.4
nS
9
2,
4, 7
TCK to
Data
Out
7.0
26.2
nS
10, 11
tpZH(3)
Output Enable
Time
VCC=4.5V
During Update-IR state
2,
4, 7
TCK to
Data
Out
6.5
19.9
nS
9
2,
4, 7
TCK to
Data
Out
6.5
23.1
nS
10, 11
tpZL(4)
Output Enable
Time
VCC=4.5V
During Test Logic Reset
2,
4, 7
TCK to
Data
Out
7.0
23.8
nS
9
2,
4, 7
TCK to
Data
Out
7.0
27.4
nS
10, 11
9
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相关代理商/技术参数 |
参数描述 |
|---|---|
| SCAN18374TFMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCAN18374TSSC | 功能描述:触发器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 电路数量:2 逻辑系列:SN74 逻辑类型:D-Type Flip-Flop 极性:Inverting, Non-Inverting 输入类型:CMOS 输出类型: 传播延迟时间:4.4 ns 高电平输出电流:- 16 mA 低电平输出电流:16 mA 电源电压-最大:5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:X2SON-8 封装:Reel |
| SCAN18374TSSCX | 功能描述:触发器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 电路数量:2 逻辑系列:SN74 逻辑类型:D-Type Flip-Flop 极性:Inverting, Non-Inverting 输入类型:CMOS 输出类型: 传播延迟时间:4.4 ns 高电平输出电流:- 16 mA 低电平输出电流:16 mA 电源电压-最大:5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:X2SON-8 封装:Reel |
| SCAN1837TSSC | 制造商:FAIRCHILD 制造商全称:Fairchild Semiconductor 功能描述:Transparent Latch with 3-STATE Outputs |
| SCAN18540_YDB3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
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