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参数资料
| 型号： | SFCA16GBH2BV4TO-I-QT-216-STD |
| 厂商： | Swissbit NA Inc |
| 文件页数： | 45/56页 |
| 文件大小： | 0K |
| 描述： | FLASH CFAST UDMA/MDMA/PIO 16GB |
| 标准包装： | 20 |
| 系列： | F-240 |
| 存储容量： | 16GB |
| 存储器类型： | 存储卡 - CFast? |
| 其它名称： | 1052-1099 |
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The data structure returned is:
Table 77: S.M.A.R.T. Data Structure
Offset
0..1
2..361
362
363
Value
0010h
00h
00h
Description
SMART structure version for firmware “1”
Attribute entries 1 to 30 (12 bytes each)
Off-line data collection status (no off-line data collection)
Self-test execution status byte (self-test completed)
364..365
0000h Total time to complete off-line data collection
366
367
00h
00h
-
Off-line data collection capability (no off-line data collection)
368..369
0003h SMART capabilities
370
371
372
373
374..385
386..387
388..391
392..395
396
397
398..401
402..405
406..510
511
00h
00h
00h
00h
00h
0004h
00h
Error logging capability (no error logging)
-
Short self-test routine recommended polling time
Extended self-test routine recommended polling time
Reserved
SMART Swissbit Structure Version for SMART for firm ware “1”
“Commit” counter
Wear Level Threshold
Global Bad Block Management active
Global Wear Leveling active
Average Flash Block Erase Count
Number of Flash Blocks involved into the Wear Leveling
-
Data structure checksum
The byte order for the multi-byte values is little Endian (least significant byte first), unless specified otherwise.
There are 12 attributes that are defined in the CF card. These return their data in the attribute section of the
SMART data, using a 12 byte data field.
The field at offset 386 gives a version number for the contents of the SMART data structure.
The byte at offset 396 is 0 if the bad block management is still working chip local, and 1 if the global bad block
management has started. This happens when one of the flash chips runs out of spare blocks, in this case spare
blocks from different flash chips are used.
The byte at offset 397 is 0 if the wear leveling has not yet started its global operation and 1 if the global wear
leveling has started. This happens when the most used chip has reached the erase count threshold defined in
the Erase Count Attribute.
In the following sections the Attributes for different SMART structure versions (Byte 0…1) are specified that may
depend on the firmware.
7.3.1 SMART Attributes for SMART structure version 0010h
7.3.1.1 Spare Block Count Attribute
This attribute gives information about the amount of available spare blocks.
Table 78: Spare Block Count Attribute for SMART structure version 0010h
Offset
0
1..2
3
4
5..7
8..10
11
Value
c4h
0003h
00h
Description
Attribute ID – Reallocation Count
Flags – Pre-fail type, value is updated during normal operation
Attribute value. The value returned here is the minimum percentage of remaining
spare blocks over all flash chips, i.e. min over all chips (100 × current spare blocks
/ initial spare blocks)
Attribute value (worst value)
sum of initial number of spare blocks for all flash chips
sum of the current number of spare blocks for all flash chips
Reserved
This attribute is used for the SMART Return Status command. If the attribute value field is less than the spare
block threshold, the SMART Return Status command will indicate a threshold exceeded condition.
Swissbit AG
Industriestrasse 4
Swissbit reserves the right to change products or specifications without notice.
Revision: 0.92
CH-9552 Bronschhofen
Switzerland
F-240_data_sheet_CA-HxBV_Rev092.doc
Page 45 of 56
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