参数资料
型号: SN54LVTH182245
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3V的ABT生根粉扫描检测装置带18位总线收发器)
文件页数: 3/34页
文件大小: 706K
代理商: SN54LVTH182245
SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
Boundary-Control
Register
Bypass Register
Identification
Register
Boundary-Scan Register
Instruction Register
TDI
TMS
TCK
TDO
1DIR
1OE
1A1
1B1
One of Nine Channels
2DIR
2OE
2A1
2B1
One of Nine Channels
TAP
Controller
VCC
VCC
1
56
55
26
31
43
30
28
29
2
14
27
VCC
VCC
P
相关PDF资料
PDF描述
SN54LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH182504AHV Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40
SN54LVTH18504AHV Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
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