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| 型号： | SN54LVTH182245 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3V的ABT生根粉扫描检测装置带18位总线收发器） |
| 文件页数： | 4/34页 |
| 文件大小： | 706K |
| 代理商： | SN54LVTH182245 |
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SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A1–1A9, 2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9, 2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1DIR, 2DIR
Normal-function direction controls. See function table for normal-mode logic.
GND
Ground
1OE, 2OE
Normal-function output enables. See function table for normal-mode logic. An internal pullup at each terminal forces
the terminal to a high level if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are
synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting
data through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its
TAP controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| SN74LVTH182245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| SN74LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
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