参数资料
型号: SN54LVTH18245
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3V的ABT生根粉扫描检测装置带18位总线收发器)
文件页数: 11/34页
文件大小: 706K
代理商: SN54LVTH18245
SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
device-identification register
The device-identification register (IDR) is 32 bits long. It can be selected and read to identify the manufacturer,
part number, and version of this device.
For the ’LVTH18245, the binary value 00000000000000011011000000101111 (0001B02F, hex) is captured
(during Capture-DR state) in the IDR to identify this device as Texas Instruments SN54/74LVTH18245.
For the ’LVTH182245, the binary value 00000000000000100000000000101111 (0002002F, hex) is captured
(during Capture-DR state) in the IDR to identify this device as Texas Instruments SN54/74LVTH182245.
The IDR order of scan is from TDI through bits 31–0 to TDO. Table 2 shows the IDR bits and their significance.
Table 2. Device-Identification Register Configuration
IDR BIT
NUMBER
IDENTIFICATION
SIGNIFICANCE
IDR BIT
NUMBER
IDENTIFICATION
SIGNIFICANCE
IDR BIT
NUMBER
IDENTIFICATION
SIGNIFICANCE
MANUFACTURER10
MANUFACTURER09
MANUFACTURER08
MANUFACTURER07
MANUFACTURER06
MANUFACTURER05
MANUFACTURER04
MANUFACTURER03
MANUFACTURER02
MANUFACTURER01
MANUFACTURER00
LOGIC1
31
VERSION3
27
PARTNUMBER15
11
30
VERSION2
26
PARTNUMBER14
10
29
VERSION1
25
PARTNUMBER13
9
28
VERSION0
24
PARTNUMBER12
8
––
––
23
PARTNUMBER11
7
––
––
22
PARTNUMBER10
6
––
––
21
PARTNUMBER09
5
––
––
20
PARTNUMBER08
4
––
––
19
PARTNUMBER07
3
––
––
18
PARTNUMBER06
2
––
––
17
PARTNUMBER05
1
––
––
16
PARTNUMBER04
0
––
––
15
PARTNUMBER03
––
––
––
––
14
PARTNUMBER02
––
––
––
––
13
PARTNUMBER01
––
––
––
––
12
PARTNUMBER00
––
––
Note that for TI products, bits 11–0 of the device-identification register always contain the binary value 000000101111
(02F, hex).
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相关PDF资料
PDF描述
SN74LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH182504AHV Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40
SN54LVTH18504AHV Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
SN54LVTH182504A 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
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