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| 型号： | SN54LVTH18245 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3V的ABT生根粉扫描检测装置带18位总线收发器） |
| 文件页数： | 27/34页 |
| 文件大小： | 706K |
| 代理商： | SN54LVTH18245 |
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SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
27
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Note 4 and Figure 14)
12
SN54LVTH18245
VCC = 3.3 V
±
0.3 V
SN74LVTH18245
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
MHz
Pulse duration
TCK high or low
A, B, DIR, or OE before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, DIR, or OE after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
9.5
ns
Setup time
6.5
tsu
2.5
ns
2.5
H ld i
Hold time
1.5
th
1.5
ns
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
NOTE 4: Product preview specifications are design goals only and are subject to change without notice.
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH182245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| SN74LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
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| SN54LVTH182504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
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| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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