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| 型号： | SN54LVTH182504AHV |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40 |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器 |
| 文件页数： | 28/35页 |
| 文件大小： | 544K |
| 代理商： | SN54LVTH182504AHV |
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SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS667B – JULY 1996 – REVISED JUNE 1997
28
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)
SN54LVTH18504A
VCC = 3.3 V
±
0.3 V
SN74LVTH18504A
VCC = 3.3 V
±
0.3 V
VCC = 2.7 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
0
80
0
100
0
80
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
4.4
5.6
4.4
5.6
ns
LEAB or LEBA high
A before CLKAB
↑
or
B before CLKBA
↑
3
3
3
3
2.4
2.8
2.4
2.8
tsu
Setup time
A before LEAB
↓
or
B before LEBA
↓
CLK high
1.5
0.7
1.5
0.7
ns
CLK low
1.6
1.6
1.6
1.6
CLKEN before CLK
↑
A after CLKAB
↑
B after CLKBA
↑
A after LEAB
↓
or B after LEBA
↓
2.8
3.4
2.8
3.4
1
0.8
1
0.8
th
Hold time
1.4
1.1
1.4
1.1
ns
3.1
3.5
3.1
3.5
CLKEN after CLK
↑
0.7
0.2
0.7
0.2
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
SN54LVTH18504A
SN74LVTH18504A
VCC = 3.3 V
±
0.3 V
VCC = 2.7 V
VCC = 3.3 V
±
0.3 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
0
40
0
50
0
40
MHz
Pulse duration
TCK high or low
9.5
10.5
9.5
10.5
ns
tsu
S t
Setup time
A, B, CLK, CLKEN, LE, or OE
before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, CLKEN, LE, or OE
after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
6.5
7
6.5
7
2.5
3.5
2.5
3.5
ns
2.5
3.5
2.5
3.5
th
H ld ti
Hold time
1.5
1
1.5
1
1.5
1
1.5
1
ns
1.5
1
1.5
1
td
tr
Delay time
50
50
50
50
ns
μ
s
Rise time
1
1
1
1
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH18504AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| SN54LVTH182504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH182646AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| SN54LVTH18646AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2000 |
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