- 您现在的位置：买卖IC网 > PDF目录373461 > SN54LVTH182516 (Texas Instruments, Inc.) 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) PDF资料下载
参数资料
| 型号： | SN54LVTH182516 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 32/36页 |
| 文件大小： | 769K |
| 代理商： | SN54LVTH182516 |
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页当前第32页第33页第34页第35页第36页
SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
32
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182516
MIN
TYP
SN74LVTH182516
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = 2.7 V to 3.6 V,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOH = –12 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
IOL = 12 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 3 V or 0.5 V
VO = 3 V or 0.5 V
–1.2
–1.2
V
VOH
A port, TDO
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC= 3 V
VCC = 3 V
2.4
2.4
2
2
B port
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
A port TDO
A port, TDO
0.2
0.2
V
0.5
0.5
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
B port
0.8
±
1
10
0.8
±
1
10
II
VCC = 3.6 V,
VCC = 0 or 3.6 V,
CLK, CLKEN,
LE, S, TCK
VCC= 3 6 V
VCC = 3.6 V
3 6 V
3 6 V
50
50
OE, TDI, TMS
1
1
μ
A
–25
–100
–25
–100
A or B ports
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
μ
A
II(h ld)§
VCC= 3 V
VCC = 3 V
A or B ports
75
75
μ
A
II(hold)§
–75
–75
IOZH
IOZL
IOZPU
IOZPD
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
TDO
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC= 3 6 V IO= 0 VI= VCCor GND
VCC = 3.6 V, IO = 0, VI = VCC or GND
3 6 V I
0 V
Outputs high
3
Outputs low
30
mA
Outputs
disabled
3
ICC
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
All typical values are at VCC = 3.3 V, TA = 25
°
C.
Unused pins at VCC or GND
§The parameter II(hold) includes the off-state output leakage current.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
0.2
0.2
mA
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
发布紧急采购，3分钟左右您将得到回复。