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| 型号： | SN54LVTH182516 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 6/36页 |
| 文件大小： | 769K |
| 代理商： | SN54LVTH182516 |
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SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
A1–A18
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B18
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
CLKENAB,
CLKENBA
Normal-function clock enables. See function table for normal-mode logic.
GND
Ground
LEAB, LEBA
Normal-function latch enables. See function table for normal-mode logic.
OEAB, OEBA
Normal-function active-low output enables. See function table for normal-mode logic. An internal pullup at each terminal
will force the terminal to a high level if left unconnected.
SAB, SBA
Normal-function select controls. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Std 1149.1-1990. Test operations of the device are synchronous TCK.
Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Std 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
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