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| 型号： | SN54LVTH182652A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 31/36页 |
| 文件大小： | 833K |
| 代理商： | SN54LVTH182652A |
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SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS312C – MARCH 1994 – REVISED JUNE 1997
31
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions
SN54LVTH182652A
MIN
SN74LVTH182652A
MIN
UNIT
MAX
MAX
VCC
VIH
VIL
VI
Supply voltage
2.7
3.6
2.7
3.6
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
Input voltage
5.5
5.5
V
IOH
High-level output current
A port, TDO
–24
–32
mA
B port
–12
–12
IOL
Low-level output current
A port, TDO
24
32
mA
B port
12
12
IOL
t/
v
TA
Current duty cycle
≤
50%, f
≥
1 kHz
Low-level output current
A port, TDO
48
64
mA
Input transition rise or fall rate
Outputs enabled
10
10
ns/V
°
C
Operating free-air temperature
–55
125
–40
85
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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