- 您现在的位置：买卖IC网 > PDF目录373461 > SN54LVTH182652A (Texas Instruments, Inc.) 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) PDF资料下载
参数资料
| 型号： | SN54LVTH182652A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 6/36页 |
| 文件大小： | 833K |
| 代理商： | SN54LVTH182652A |
第1页第2页第3页第4页第5页当前第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页第32页第33页第34页第35页第36页
SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS312C – MARCH 1994 – REVISED JUNE 1997
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A1–1A9,
2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
GND
Ground
1OEAB, 2OEAB
Normal-function active-high output enables. See function table for normal-mode logic. An internal pulldown at each
terminal forces the terminal to a low level if left unconnected.
1OEBA, 2OEBA
Normal-function active-low output enables. See function table for normal-mode logic. An internal pullup at each terminal
forces the terminal to a high level if left unconnected.
1SAB, 1SBA,
2SAB, 2SBA
Normal-function select controls. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Std 1149.1-1990. Test operations of the device are synchronous TCK.
Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Std 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH2245 | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: 20 LEAD PDIP; No of Pins: 20; Container: Rail; Qty per Container: 18 |
| SN54LVTH2245J | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| SN54LVTH2245W | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
| SN74LVTH2245DB | 3.3-V ABT OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN54LVTH2245FK | Octal 3-State Non-Inverting Transparent Latch; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
发布紧急采购，3分钟左右您将得到回复。