参数资料
型号: SN65LVDS250_07
厂商: Texas Instruments, Inc.
英文描述: LVDS 4x4 CROSSPOINT SWITCH
中文描述: LVDS的4 × 4交叉点开关
文件页数: 4/18页
文件大小: 531K
代理商: SN65LVDS250_07
www.ti.com
PACKAGE DISSIPATION RATINGS
THERMAL CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1)
SN65LVDS250
SN65LVDT250
SLLS594B–MARCH 2004–REVISED OCTOBER 2004
Table 1. CROSSPOINT LOGIC TABLES
OUTPUT CHANNEL 1
CONTROL
PINS
S10
S11
0
0
0
1
1
0
1
1
OUTPUT CHANNEL 2
CONTROL
PINS
S20
S21
0
0
0
1
1
0
1
1
OUTPUT CHANNEL 3
CONTROL
PINS
S30
S31
0
0
0
1
1
0
1
1
OUTPUT CHANNEL 4
CONTROL
PINS
S40
S41
0
0
0
1
1
0
1
1
INPUT
SELECTED
1Y/1Z
1A/1B
2A/2B
3A/3B
4A/4B
INPUT
SELECTED
2Y/2Z
1A/1B
2A/2B
3A/3B
4A/4B
INPUT
SELECTED
3Y/3Z
1A/1B
2A/2B
3A/3B
4A/4B
INPUT
SELECTED
4Y/4Z
1A/1B
2A/2B
3A/3B
4A/4B
CIRCUIT BOARD
MODEL
Low-K
(2)
High-K
(3)
T
25
°
C
POWER RATING
1038 mW
1772 mW
DERATING FACTOR
(1)
ABOVE T
A
= 25
°
C
9.0 mW/
°
C
15.4 mW/
°
C
T
= 85
°
C
POWER RATING
496 mW
847 mW
PACKAGE
TSSOP (DBT)
TSSOP (DBT)
(1)
(2)
(3)
This is the inverse of the junction-to-ambient thermal resistance when board-mounded and with no air flow.
In accordance with the Low-K thermal metric definitions of EIA/JESD51-6
In accordance with the High-K thermal metric definitions of EIA/JESD51-6
PARAMETER
TEST CONDITIONS
VALUE
40.3
8.5
356
522
UNITS
Θ
JB
Θ
JC
Junction-to-board thermal resistance
Junction-to-case thermal resistance
°
C/W
V
CC
= 3.3 V, T
A
= 25
°
C, 1 GHz
V
CC
= 3.6 V, T
A
= 85
°
C, 1 GHz
mW
mW
P
D
Device power dissipation
UNITS
-0.5 V to 4 V
-0.5 V to 4 V
-0.5 V to 4 V
1 V
-0.5 V to 4 V
±
3 kV
±
500 V
Supply voltage range, V
CC
S, DE
A, B
|V
A
- V
B
| (LVDT only)
Y, Z
Human body model
(3)
Charged-device model
(4)
Voltage range
(2)
All pins
All pins
Electrostatic discharge
Continuous power dissipation
See Dissipation Rating Table
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
Tested in accordance with JEDEC Standard 22, Test Method A114-A.
Tested in accordance with JEDEC Standard 22, Test Method C101.
(2)
(3)
(4)
4
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