参数资料
型号: SN74LS174DR2
厂商: ON SEMICONDUCTOR
元件分类: 锁存器
英文描述: LS SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, PDSO16
封装: PLASTIC, SOIC-16
文件页数: 4/7页
文件大小: 178K
代理商: SN74LS174DR2
SN74LS174
http://onsemi.com
4
AC CHARACTERISTICS (TA = 25°C)
Symbol
Parameter
Limits
Unit
Test Conditions
Min
Typ
Max
fMAX
Maximum Input Clock Frequency
30
40
MHz
VCC = 5.0 V
CL = 15 pF
tPHL
Propagation Delay, MR to Output
23
35
ns
tPLH
tPHL
Propagation Delay, Clock to Output
20
21
30
ns
AC SETUP REQUIREMENTS (TA = 25°C)
Symbol
Parameter
Limits
Unit
Test Conditions
Min
Typ
Max
tW
Clock or MR Pulse Width
20
ns
VCC = 5.0 V
ts
Data Setup Time
20
ns
th
Data Hold Time
5.0
ns
trec
Recovery Time
25
ns
AC WAVEFORMS
Figure 1. Clock to Output Delays, Clock Pulse Width,
Frequency, Setup and Hold Times Data to Clock
Figure 2. Master Reset to Output Delay, Master Reset
Pulse Width, and Master Reset Recovery Time
*The shaded areas indicate when the input is permitted to
*change for predictable output performance.
1.3 V
1/fmax
tw
ts(H)
th(H)
ts(L)
th(L)
CP
tPHL
tPLH
tW
tPHL
CP
trec
Q
MR
D
Q
*
1.3 V
DEFINITIONS OF TERMS
SETUP TIME (ts) — is defined as the minimum time
required for the correct logic level to be present at the logic
input prior to the clock transition from LOW to HIGH in
order to be recognized and transferred to the outputs.
HOLD TIME (th) — is defined as the minimum time
following the clock transition from LOW to HIGH that the
logic level must be maintained at the input in order to ensure
continued recognition. A negative HOLD TIME indicates
that the correct logic level may be released prior to the clock
transition from LOW to HIGH and still be recognized.
RECOVERY TIME (trec) — is defined as the minimum time
required between the end of the reset pulse and the clock
transition from LOW to HIGH in order to recognize and
transfer HIGH Data to the Q outputs.
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