参数资料
型号: SN74LVC1G00DCKTE4
厂商: TEXAS INSTRUMENTS INC
元件分类: 门电路
英文描述: LVC/LCX/Z SERIES, 2-INPUT NAND GATE, PDSO5
封装: GREEN, PLASTIC, SC-70, 5 PIN
文件页数: 1/19页
文件大小: 843K
代理商: SN74LVC1G00DCKTE4
See mechanical drawings for dimensions.
NC – No internal connection
DBV PACKAGE
(TOP VIEW)
2
5
3
4
Y
1
B
GND
A
V
CC
DCK PACKAGE
(TOP VIEW)
3
4
GND
2
B
Y
1
A
5
V
CC
DRL PACKAGE
(TOP VIEW)
2
B
1
A
3
4
GND
Y
5
V
CC
YZP PACKAGE
(BOTTOM VIEW)
2
B
1
A
GND
4
3
Y
5
V
CC
DRY PACKAGE
(TOP VIEW)
B
NC
A
6
5
4
2
3
GND
Y
V
CC
1
6
5
4
2
3
1
DSF PACKAGE
(TOP VIEW)
B
A
GND
NC
Y
V
CC
SCES212W
– APRIL 1999 – REVISED MARCH 2011
SINGLE 2-INPUT POSITIVE-NAND GATE
Check for Samples: SN74LVC1G00
1
FEATURES
Available in the Texas Instruments NanoStar
Ioff Supports Partial-Power-Down Mode
Package
Operation
Supports 5-V VCC Operation
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
Inputs Accept Voltages to 5.5 V
ESD Protection Exceeds JESD 22
Max tpd of 3.8 ns at 3.3 V
– 2000-V Human-Body Model (A114-A)
Low Power Consumption, 10-
μA Max ICC
– 1000-V Charged-Device Model (C101)
±24-mA Output Drive at 3.3 V
DESCRIPTION/ORDERING INFORMATION
This single 2-input positive-NAND gate is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G00 performs the Boolean function Y = A
● B or Y = A + B in positive logic.
NanoStar
package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright
1999–2011, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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