参数资料
型号: SN74LVTH16952DGG
厂商: Texas Instruments, Inc.
元件分类: 通用总线功能
英文描述: Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 0.018uF; Working Voltage (Vdc)[max]: 50V; Capacitance Tolerance: +/-10%; Dielectric: Multilayer Ceramic; Temperature Coefficient: X7R (BX); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: 100% Tin (Sn); Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: S Failure Rate
中文描述: 的3.3V ABT生根粉16位收发登记,3态输出
文件页数: 9/13页
文件大小: 211K
代理商: SN74LVTH16952DGG
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package
Type
CFP
TSSOP
Package
Drawing
WD
DGG
Pins Package
Qty
1
2000
Eco Plan
(2)
Lead/Ball Finish
MSL Peak Temp
(3)
5962-9684901QXA
74LVTH16952DGGRE4
ACTIVE
ACTIVE
56
56
TBD
Pb-Free
(RoHS)
Call TI
CU NIPDAU
Level-NC-NC-NC
Level-1-250C-UNLIM
74LVTH16952DLRG4
ACTIVE
SSOP
DL
56
1000 Green (RoHS &
no Sb/Br)
2000
Pb-Free
(RoHS)
20
Green (RoHS &
no Sb/Br)
1000 Green (RoHS &
no Sb/Br)
1
CU NIPDAU
Level-1-260C-UNLIM
SN74LVTH16952DGGR
ACTIVE
TSSOP
DGG
56
CU NIPDAU
Level-1-250C-UNLIM
SN74LVTH16952DL
ACTIVE
SSOP
DL
56
CU NIPDAU
Level-1-260C-UNLIM
SN74LVTH16952DLR
ACTIVE
SSOP
DL
56
CU NIPDAU
Level-1-260C-UNLIM
SNJ54LVTH16952WD
ACTIVE
CFP
WD
56
TBD
Call TI
Level-NC-NC-NC
(1)
The marketing status values are defined as follows:
ACTIVE:
Product device recommended for new designs.
LIFEBUY:
TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND:
Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW:
Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE:
TI has discontinued the production of the device.
(2)
for the latest availability information and additional product content details.
The Pb-Free/Green conversion plan has not been defined.
相关PDF资料
PDF描述
SN54LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH182504AHV Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40
相关代理商/技术参数
参数描述
SN74LVTH16952DGGR 功能描述:总线收发器 16bit ABT RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel
SN74LVTH16952DL 功能描述:总线收发器 16bit ABT RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel
SN74LVTH16952DLG4 功能描述:总线收发器 10-Bit Buffer/Driver With 3-State Outputs RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel
SN74LVTH16952DLR 功能描述:总线收发器 3.3 V ABT 16-Bit Reg Trncvr W/3-St Otpt RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel
SN74LVTH182502APM 功能描述:特定功能逻辑 10-Bit Buffer/Driver With 3-State Outputs RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube