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| 型号： | SN74LVTH182245 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3V的ABT生根粉扫描检测装置带18位总线收发器） |
| 文件页数： | 2/34页 |
| 文件大小： | 706K |
| 代理商： | SN74LVTH182245 |
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SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
OE can be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPE
bus transceivers is inhibited and the test circuitry is
enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs
boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of ’LVTH182245, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN74LVTH18245 and SN54LVTH182245 are available in TI’s shrink small-outline (DL) and thin shrink
small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline
packages in the same printed-circuit-board area.
The SN54LVTH18245 and SN54LVTH182245 are characterized for operation over the full military temperature
range of –55
°
C to 125
°
C. The SN74LVTH18245 and SN74LVTH182245 are characterized for operation from
–40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
OE
OPERATION
DIR
L
L
B data to A bus
L
H
A data to B bus
H
X
Isolation
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH18245 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器) |
| SN54LVTH182504AHV | Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40 |
| SN54LVTH18504AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| SN54LVTH182504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74LVTH182502APM | 功能描述:特定功能逻辑 10-Bit Buffer/Driver With 3-State Outputs RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH182502APMR | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH182504A | 制造商:GTC 功能描述: |
| SN74LVTH182504APM | 功能描述:特定功能逻辑 Octal Bus Interface F-F W/3-State Otpt RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH182512DGGR | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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