参数资料
型号: SN74LVTH182245
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
中文描述: 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器(3.3V的ABT生根粉扫描检测装置带18位总线收发器)
文件页数: 28/34页
文件大小: 706K
代理商: SN74LVTH182245
SN54LVTH18245, SN54LVTH182245, SN74LVTH18245, SN74LVTH182245
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS161C – AUGUST 1993 – REVISED JULY 1996
28
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (normal mode) (see Note 4 and Figure 14)
12
PARAMETER
FROM
(INPUT)
TO
SN54LVTH18245
VCC = 3.3 V
±
0.3 V
SN74LVTH18245
VCC = 3.3 V
±
0.3 V
UNIT
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
1.5
MAX
5.5
MIN
MAX
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
A or B
B or A
ns
1.5
5.5
OE
B or A
2
9.5
ns
2
9.5
OE
B or A
2.5
2.5
10.5
9.5
ns
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (test mode) (see Note 4 and Figure 14)
PARAMETER
FROM
(INPUT)
TO
SN54LVTH18245
VCC = 3.3 V
±
0.3 V
SN74LVTH18245
VCC = 3.3 V
±
0.3 V
UNIT
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
TCK
50
MHz
TCK
A or B
2.5
15
ns
2.5
15
TCK
TDO
1.5
7
ns
1.5
7
TCK
A or B
3
18
ns
3
18
TCK
TDO
1.5
7
ns
1.5
7
TCK
A or B
3
19
ns
3
19
TCK
TDO
1.5
1.5
8
8
ns
NOTE 4: Product preview specifications are design goals only and are subject to change without notice.
P
相关PDF资料
PDF描述
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH182504AHV Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Rail; Qty per Container: 40
SN54LVTH18504AHV Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
SN54LVTH182504A 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
SN54LVTH18504A 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
相关代理商/技术参数
参数描述
SN74LVTH182502APM 功能描述:特定功能逻辑 10-Bit Buffer/Driver With 3-State Outputs RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube
SN74LVTH182502APMR 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube
SN74LVTH182504A 制造商:GTC 功能描述:
SN74LVTH182504APM 功能描述:特定功能逻辑 Octal Bus Interface F-F W/3-State Otpt RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube
SN74LVTH182512DGGR 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube