参数资料
型号: SN74LVTH182514
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器(3.3V的ABT生根粉扫描测试装置(20位通用总线收发器))
文件页数: 29/34页
文件大小: 734K
代理商: SN74LVTH182514
SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
29
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 4)
SN54LVTH182514
MIN
SN74LVTH182514
MIN
UNIT
MAX
MAX
VCC
VIH
VIL
VI
Supply voltage
2.7
3.6
2.7
3.6
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
Input voltage
5.5
5.5
V
IOH
High-level output current
A port, TDO
–24
–32
mA
B port
–12
–12
IOL
Low-level output current
A port, TDO
24
32
mA
B port
12
12
IOL
t/
v
TA
Current duty cycle
50%, f
1 kHz
NOTE 4: Unused control inputs must be held high or low to prevent them from floating.
Low-level output current
A port, TDO
48
64
mA
Input transition rise or fall rate
Outputs enabled
10
10
ns/V
°
C
Operating free-air temperature
–55
125
–40
85
P
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