参数资料
型号: SN74LVTH182514
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器(3.3V的ABT生根粉扫描测试装置(20位通用总线收发器))
文件页数: 31/34页
文件大小: 734K
代理商: SN74LVTH182514
SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
31
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)
SN54LVTH182514
VCC = 3.3 V
±
0.3 V
SN74LVTH182514
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
4.4
ns
LEAB or LEBA high
A before CLKAB
or
B before CLKBA
3
Setup time
2.8
tsu
A before LEAB
or
B before LEBA
CLK high
1.5
ns
CLK low
1.6
CLKEN before CLK
A after CLKAB
or
B after CLKBA
A after LEAB
or B after LEBA
CLKEN after CLK
2.8
th
Hold time
1.4
ns
3.1
0.7
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
SN54LVTH182514
VCC = 3.3 V
±
0.3 V
SN74LVTH182514
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
MHz
Pulse duration
TCK high or low
9.5
ns
tsu
Setup time
A, B, CLK, CLKEN, LE, or OE
before TCK
TDI before TCK
TMS before TCK
A, B, CLK, CLKEN, LE, or OE
after TCK
TDI after TCK
TMS after TCK
Power up to TCK
VCC power up
6.5
ns
2.5
2.5
th
Hold time
1.5
ns
1.5
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
相关PDF资料
PDF描述
SN54LVTH18516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN74LVTH18516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN54LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN74LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器))
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