参数资料
型号: SN74SSTL16847
厂商: Texas Instruments, Inc.
英文描述: 20-Bit SSTL_3 Interface Buffer With 3-State Outputs
中文描述: 具有三态输出的 20 位 SSTL_3 接口缓冲器
文件页数: 1/6页
文件大小: 88K
代理商: SN74SSTL16847
SN74SSTL16847
20-BIT SSTL_3 INTERFACE BUFFER
WITH 3-STATE OUTPUTS
SCBS709A – OCTOBER 1997 – REVISED MAY 1998
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Member of the Texas Instruments
Widebus
Family
Supports SSTL_3 Signal Inputs and
Outputs
Flow-Through Architecture Optimizes PCB
Layout
Meets SSTL_3 Class I and Class II
Specifications
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Latch-Up Performance Exceeds 250 mA Per
JESD 17
Packaged in Plastic Thin Shrink
Small-Outline Package
description
This 20-bit buffer is designed for 3-V to 3.6-V V
CC
operation and SSTL_3 input levels.
Data flow from A to Y is controlled by the
output-enable (OE). When OE is high, the outputs
are in the high-impedance state.
To ensure the high-impedance state during power
up or power down, OE should be tied to V
CC
through a pullup resistor; the minimum value of
the resistor is determined by the current-sinking
capability of the driver.
The SN74SSTL16847 is characterized for
operation from 0
°
C to 70
°
C.
Copyright
1998, Texas Instruments Incorporated
Widebus is a trademark of Texas Instruments Incorporated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
DGG PACKAGE
(TOP VIEW)
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Y1
Y2
GND
Y3
Y4
V
DDQ
Y5
Y6
GND
Y7
Y8
V
DDQ
Y9
Y10
GND
OE
V
REF
GND
Y11
Y12
V
DDQ
Y13
Y14
GND
Y15
Y16
V
DDQ
Y17
Y18
GND
Y19
Y20
A1
A2
GND
A3
A4
V
CC
A5
A6
GND
A7
A8
V
CC
A9
A10
GND
NC
NC
GND
A11
A12
V
CC
A13
A14
GND
A15
A16
V
CC
A17
A18
GND
A19
A20
NC – No internal connection
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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