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参数资料
| 型号： | SNJ54ABT843W |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | ABT SERIES, 9-BIT DRIVER, TRUE OUTPUT, CDFP24 |
| 封装： | CERAMIC, DFP-24 |
| 文件页数： | 14/19页 |
| 文件大小： | 593K |
| 代理商： | SNJ54ABT843W |
SN54ABT843, SN74ABT843
9-BIT BUS-INTERFACE D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCBS197D – FEBRUARY 1991 – REVISED MAY 1997
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 3)
SN54ABT843
SN74ABT843
UNIT
MIN
MAX
MIN
MAX
UNIT
VCC
Supply voltage
4.5
5.5
4.5
5.5
V
VIH
High-level input voltage
2
V
VIL
Low-level input voltage
0.8
V
VI
Input voltage
0
VCC
0
VCC
V
IOH
High-level output current
–24
–32
mA
IOL
Low-level output current
48
64
mA
t/v
Input transition rise or fall rate
5
ns/V
TA
Operating free-air temperature
–55
125
–40
85
°C
NOTE 3: Unused inputs must be held high or low to prevent them from floating.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT843
SN74ABT843
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = –18 mA
–1.2
V
VCC = 4.5 V,
IOH = –3 mA
2.5
VOH
VCC = 5 V,
IOH = –3 mA
3
V
VOH
VCC =4 5V
IOH = –24 mA
2
V
VCC = 4.5 V
IOH = –32 mA
2*
2
VOL
VCC =4 5V
IOL = 48 mA
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
Vhys
100
mV
II
VCC = 5.5 V,
VI = VCC or GND
±1
A
IOZH
VCC = 5.5 V,
VO = 2.7 V
10
A
IOZL
VCC = 5.5 V,
VO = 0.5 V
–10
A
Ioff
VCC = 0,
VI or VO ≤ 4.5 V
±100
A
ICEX
VCC = 5.5 V,
VO = 5.5 V
Outputs high
50
A
IO§
VCC = 5.5 V,
VO = 2.5 V
–50
–140
–180
–50
–180
–50
–180
mA
V5 5 V I
O
Outputs high
1
250
A
ICC
VCC = 5.5 V, IO = Open,
VI =VCC or GND
Outputs low
24
34
mA
VI = VCC or GND
Outputs disabled
0.5
250
A
ICC
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
mA
Ci
VI = 2.5 V or 0.5 V
4
pF
Co
VO = 2.5 V or 0.5 V
7
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§ Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
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