参数资料
型号: SPC560B50L5C5E0Y
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 64 MHz, MICROCONTROLLER, PQFP144
封装: 20 X 20 MM, 1.40 MM HEIGHT, ROHS COMPLIANT, LQFP-144
文件页数: 30/74页
文件大小: 971K
代理商: SPC560B50L5C5E0Y
SPC560Bx, SPC560Cx
Electrical characteristics
Doc ID 14619 Rev 4
ECC circuitry provides correction of single bit faults and is used to improve further
automotive reliability results. Some units will experience single bit corrections throughout
the life of the product with no impact to product reliability.
4.11.2
Flash power supply DC characteristics
Table 27 shows the power supply DC characteristics on external supply.
Retention CC C
Minimum data retention at 85 °C
average ambient temperature(2)
Blocks with
0–1000 P/E cycles
20
years
Blocks with
10000 P/E cycles
10
years
Blocks with
100000 P/E cycles
1–5
years
1.
To be confirmed
2.
Ambient temperature averaged over duration of application, not to exceed recommended product operating temperature
range.
Table 25.
Flash module life (continued)
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Table 26.
Flash read access timing
Symbol
C
Parameter
Conditions(1)
Max
Unit
fREAD
CC
P
Maximum frequency for Flash reading
2 wait states
64
MHz
C
1 wait state
40
C
0 wait states
20
1.
VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified
Table 27.
Flash power supply DC electrical characteristics
Symbol
C
Parameter
Conditions(1)
Value(2)
Unit
Min Typ Max
IFREAD CC D
Sum of the current consumption
on VDDHV and VDDBV on read access
Flash module read
fCPU = 64 MHz
(3)
——
33
mA
IFMOD CC D
Sum of the current consumption
on VDDHV and VDDBV
on matrix modification (program/erase)
Program/Erase on-going while
reading Flash registers
fCPU = 64 MHz
——
33
mA
IFLPW CC D
Sum of the current consumption
on VDDHV and VDDBV
during Flash low-power mode
——
900
A
IFPWD CC D
Sum of the current consumption
on VDDHV and VDDBV
during Flash powe-down mode
——
150
A
1.
VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified
2.
All values need to be confirmed during device validation.
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