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参数资料
| 型号： | SPT1175ACU |
| 厂商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分类： | ADC |
| 英文描述： | 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, UUC24 |
| 封装： | DIE |
| 文件页数： | 3/8页 |
| 文件大小： | 76K |
| 代理商： | SPT1175ACU |
SPT
3
6/24/97
SPT1175
ELECTRICAL SPECIFICATIONS
TA=+25 °C, AVDD=DVDD=+5.0 V, AGND=DGND=0.0 V, VRB=+0.6 V and VRT=+2.6 V, unless otherwise specified.
TEST
SPT1175
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Dynamic Performance
Signal-To-Noise Ratio
fS= 20 MSPS
fIN=1.0 MHz
I
44
46
dB
fIN=3.58 MHz
I
43
45
dB
fIN=10 MHz
V
39
dB
Spurious Free
Dynamic Range
fS= 20 MSPS
fIN=1.0 MHz
I
44
47
dB
fIN=3.58 MHz
I
41
44
dB
fIN=10 MHz
V
33
dB
Differential Phase
NTSC 20 IRE Mod Ramp
V
0.7
Degrees
Differential Gain
fS = 14.3 MSPS
V
1.0
%
Digital Inputs
Input Current, Logic High
VDD = 5.25 V, VIH = VDD
I
1.0
A
Input Current, Logic Low
VDD = 5.25 V, VIL = DGND
I
1.0
A
Pulse Width High (CLK)
IV
15
ns
Pulse Width Low (CLK)
IV
15
ns
Voltage, Logic High
I
4.0
V
Voltage, Logic Low
I
1.0
V
Digital Outputs
Output Current, High
VDD = 4.75 V
IV
-1.1
mA
Output Current, Low
VDD = 4.75 V
IV
3.5
mA
Output Current, High Z
VDD = 5.25 V, OE= VDD
IV
16
A
Voltage High
I
4.0
V
Voltage Low
I
0.4
V
Power Supply Requirements
Analog Supply Voltage (AVDD)
IV
+4.75
+5.0
+5.25
V
Digital Supply Voltage (DVDD)
IV
+4.75
+5.0
+5.25
V
Supply Voltage Difference
(AVDD -DVDD)
IV
-0.1
0.0
0.1
V
Supply Current
fS=20 MSPS
I
18
27
mA
Power Dissipation
I
90
135
mW
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
TEST LEVEL CODES
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guar-
anteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any blank section in
the data column indicates that the specification is not
tested at the specified condition.
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