参数资料
型号: SQ3460EV-T1-GE3
厂商: Vishay Siliconix
文件页数: 2/11页
文件大小: 0K
描述: MOSFET N-CH 20V 8A 6TSOP
特色产品: SQ Series Power MOSFETs
标准包装: 1
系列: TrenchFET®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 20V
电流 - 连续漏极(Id) @ 25° C: 8A
开态Rds(最大)@ Id, Vgs @ 25° C: 30 毫欧 @ 5.1A,4.5V
Id 时的 Vgs(th)(最大): 1V @ 250µA
闸电荷(Qg) @ Vgs: 14nC @ 4.5V
输入电容 (Ciss) @ Vds: 1060pF @ 10V
功率 - 最大: 3.6W
安装类型: 表面贴装
封装/外壳: SC-74,SOT-457
供应商设备封装: 6-TSOP
包装: 标准包装
其它名称: SQ3460EV-T1-GE3DKR
SQ3460EV
www.vishay.com
SPECIFICATIONS (T C = 25 °C, unless otherwise noted)
Vishay Siliconix
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
Gate-Source Threshold Voltage
Gate-Source Leakage
V DS
V GS(th)
I GSS
V GS = 0, I D = 250 μA
V DS = V GS , I D = 250 μA
V DS = 0 V, V GS = ± 8 V
V GS = 0 V
V DS = 20 V
20
0.4
-
-
-
0.6
-
-
-
1.0
± 100
1
V
nA
Zero Gate Voltage Drain Current
I DSS
V GS = 0 V
V DS = 20 V, T J = 125 °C
-
-
50
μA
V GS = 0 V
V DS = 20 V, T J = 175 °C
-
-
150
On-State Drain Current a
I D(on)
V GS = 4.5 V
V DS ??? 5 V
10
-
-
A
V GS = 4.5 V
V GS = 4.5 V
I D = 5.1 A
I D = 5.1 A, T J = 125 °C
-
-
0.025
-
0.030
0.045
Drain-Source On-State Resistance a
R DS(on)
V GS = 4.5 V
I D = 5.1 A, T J = 175 °C
-
-
0.053
?
V GS = 2.5 V
V GS = 1.8 V
I D = 4.7 A
I D = 2.5 A
-
-
0.027
0.031
0.034
0.038
Forward
Transconductance b
g fs
V DS = 15 V, I D = 5.1 A
-
28
-
S
Dynamic b
Input Capacitance
C iss
-
848
1060
Output Capacitance
C oss
V GS = 0 V
V DS = 10 V, f = 1 MHz
-
117
146
pF
Reverse Transfer Capacitance
Total Gate Charge c
C rss
Q g
-
-
68
9.3
85
14
Gate-Source Charge c
Q gs
V GS = 4.5 V
V DS = 10 V, I D = 5.1 A
-
1.1
-
nC
Gate-Drain Charge c
Q gd
-
1.4
-
Gate Resistance
Turn-On Delay Time c
Rise Time c
Turn-Off Delay Time c
Fall Time c
R g
t d(on)
t r
t d(off)
t f
f = 1 MHz
V DD = 10 V, R L = 10 ?
I D ? 1 A, V GEN = 4.5 V, R g = 1 ?
6.2
-
-
-
-
12.4
8
8
21
8
18.6
12
12
32
12
?
ns
Source-Drain Diode Ratings and
Characteristics b
Pulsed Current a
I SM
-
-
32
A
Forward Voltage
V SD
I F = 5 A, V GS = 0
-
0.77
1.2
V
Notes
a. Pulse test; pulse width ? 300 μs, duty cycle ? 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
S11-2359-Rev. D, 05-Dec-11
2
Document Number: 67037
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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