参数资料
型号: SSTUA32866EC,518
厂商: NXP SEMICONDUCTORS
元件分类: 锁存器
英文描述: 32866 SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, PBGA96
封装: 13.50 X 5.50 MM, 1.05 MM HEIGHT, PLASTIC, SOT-536-1, LFBGA-96
文件页数: 26/28页
文件大小: 153K
代理商: SSTUA32866EC,518
SSTUA32866_2
NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 02 — 26 March 2007
7 of 28
NXP Semiconductors
SSTUA32866
1.8 V DDR2-667 congurable registered buffer with parity
[1]
Depends on conguration. See Figure 4, Figure 5, and Figure 6 for ball number.
[2]
Data inputs = D2, D3, D5, D6, D8 to D25 when C0 = 0 and C1 = 0.
Data inputs = D2, D3, D5, D6, D8 to D14 when C0 = 0 and C1 = 1.
Data inputs = D1 to D6, D8 to D10, D12, D13 when C0 = 1 and C1 = 1.
[3]
Data outputs = Q2, Q3, Q5, Q6, Q8 to Q25 when C0 = 0 and C1 = 0.
Data outputs = Q2, Q3, Q5, Q6, Q8 to Q14 when C0 = 0 and C1 = 1.
Data outputs = Q1 to Q6, Q8 to Q10, Q12, Q13 when C0 = 1 and C1 = 1.
7.
Functional description
The SSTUA32866 is a 25-bit 1 : 1 or 14-bit 1 : 2 congurable registered buffer with parity,
designed for 1.7 V to 2.0 V VDD operation.
All clock and data inputs are compatible with the JEDEC standard for SSTL_18. The
control and reset (RESET) inputs are LVCMOS. All data outputs are 1.8 V CMOS drivers
that have been optimized to drive the DDR2 DIMM load, and meet SSTL_18
specications. The error (QERR) output is 1.8 V open-drain driver.
The SSTUA32866 operates from a differential clock (CK and CK). Data are registered at
the crossing of CK going HIGH, and CK going LOW.
The C0 input controls the pinout conguration for the 1 : 2 pinout from A conguration
(when LOW) to B conguration (when HIGH). The C1 input controls the pinout
conguration from 25-bit 1 : 1 (when LOW) to 14-bit 1 : 2 (when HIGH).
The SSTUA32866 accepts a parity bit from the memory controller on its parity bit
(PAR_IN) input, compares it with the data received on the DIMM-independent D-inputs
and indicates whether a parity error has occurred on its open-drain QERR pin
(active LOW). The convention is even parity, that is, valid parity is dened as an even
number of ones across the DIMM-independent data inputs combined with the parity input
bit.
When used as a single device, the C0 and C1 inputs are tied LOW. In this conguration,
parity is checked on the PAR_IN input which arrives one cycle after the input data to which
it applies. The Partial-Parity-Out (PPO) and QERR signals are produced three cycles after
the corresponding data inputs.
When used in pairs, the C0 input of the rst register is tied LOW and the C0 input of the
second register is tied HIGH. The C1 input of both registers are tied HIGH. Parity, which
arrives one cycle after the data input to which it applies, is checked on the PAR_IN input of
the rst device. The PPO and QERR signals are produced on the second device three
clock cycles after the corresponding data inputs. The PPO output of the rst register is
QERR
D2
open-drain
output
Output error bit (active LOW). Generated
one clock cycle after the corresponding
data output
n.c.
-
Not connected. Ball present but no
internal connection to the die.
DNU
-
Do not use. Inputs are in
standby-equivalent mode and outputs
are driven LOW.
Table 2.
Pin description …continued
Symbol
Pin
Type
Description
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