参数资料
型号: ST72PSCR1x4T1
厂商: 意法半导体
英文描述: 8-BIT LOW-POWER, FULL-SPEED USB MCU WITH 16K FLASH, 768 RAM, SMARTCARD I/F, TIMER
中文描述: 8位低功耗,全速USB微控制器与16K的闪存,768内存,智能卡的I /楼,计时器
文件页数: 86/102页
文件大小: 1413K
代理商: ST72PSCR1X4T1
ST7SCR
86/102
EMC CHARACTERISTICS
(Cont’d)
14.7.2.3 Static and Dynamic Latch-Up
I
LU: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 ST7 application note.
I
DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in
Figure 41
. For
more details, refer to the AN1181 ST7
application note.
Electrical Sensitivities
Figure 41. Simplified Diagram of the ESD Generator for DLU
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
Symbol
Parameter
Conditions
Class
1)
LU
DLU
Static latch-up class
Dynamic latch-up class
T
A
=
+25°C
V
DD
=
5.5V, f
OSC
=
4MHz, T
A
=
+25°C
A
A
R
CH
=50M
R
D
=330
C
S
=
150pF
ESD
GENERATOR
2)
HV RELAY
DISCHARGE TIP
DISCHARGE
RETURN CONNECTION
ST7
V
DD
V
SS
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