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Electrical characteristics
ST7L34, ST7L35, ST7L38, ST7L39
Doc ID 11928 Rev 7
13.7.3
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, DLU and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: the human body model and the machine model. This test conforms to the
JESD22-A114A/A115A standard.
Static and dynamic latch-up (LU)
LU: Three complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer
to application note AN1181.
DLU: Electro-Static Discharges (one positive then one negative test) are applied to each pin
of three samples when the micro is running to assess the latch-up performance in dynamic
mode. Power supplies are set to the typical values, the oscillator is connected as near as
possible to the pins of the micro and the component is put in reset mode. This test conforms
to the IEC1000-4-2 and SAEJ1752/3 standards. For more details, refer to the application
note AN1181.
Electrical sensitivities
Table 118.
ESD absolute maximum ratings
Symbol
Ratings
Conditions
Maximum value(1)
1.
Data based on characterization results, not tested in production
Unit
VESD(HBM)
Electro-static discharge voltage
(Human body model)
TA = +25 °C
4000
V
VESD(MM)
Electro-static discharge voltage
(Machine model)
400
VESD(CDM)
Electro-static discharge voltage
(Charged device model)
1000
Table 119.
Latch up results
Symbol
Parameter
Conditions
Class(1)
1.
Class description: A class is an STMicroelectronics internal specification. All its limits are higher than the
JEDEC specifications, which means when a device belongs to class A it exceeds the JEDEC standard.
Class B strictly covers all the JEDEC criteria (international standard). Class B strictly covers all the JEDEC
criteria (international standard)
LU
Static latch-up class
TA = 25 °C
TA = 125 °C
A
DLU
Dynamic latch-up class
VDD = 5.5 V, fOSC = 4 MHz, TA = 25 °C