参数资料
型号: ST7FLU05MAE
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 8-BIT, FLASH, 8 MHz, MICROCONTROLLER, PDSO8
封装: 0.150 INCH, LEAD FREE, PLASTIC, SOP-8
文件页数: 6/124页
文件大小: 2186K
代理商: ST7FLU05MAE
Obsolete
Product(s)
- Obsolete
Product(s)
ST7LUS5, ST7LU05, ST7LU09
Electrical characteristics
103/124
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore, it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Table 75.
EMS test results
Symbol
Parameter
Conditions
Level/
class
VFESD
Voltage limits to be applied on any I/O
pin to induce a functional disturbance
VDD = 5V, TA = +25°C, fOSC = 8 MHz,
SO8 package,
conforms to IEC 1000-4-2
3B
VFFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VDD
pins to induce a functional disturbance
VDD =5V, TA = +25°C, fOSC =8MHz,
SO8 package,
conforms to IEC 1000-4-4
4A
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