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| 型号： | ST7SCR |
| 厂商： | 意法半导体 |
| 英文描述： | 8-BIT LOW-POWER, FULL-SPEED USB MCU WITH 16K FLASH, 768 RAM, SMARTCARD I/F, TIMER |
| 中文描述： | 8位低功耗，全速USB微控制器与16K的闪存，768内存，智能卡的I /楼，计时器 |
| 文件页数： | 84/102页 |
| 文件大小： | 1413K |
| 代理商： | ST7SCR |
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ST7SCR
84/102
14.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
14.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
I
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
I
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
DD
and V
SS
through
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
A device reset allows normal operations to be re-
sumed.
Notes:
1. Data based on characterization results, not tested in production.
Symbol
Parameter
Conditions
Neg
1)
Pos
1)
Unit
V
FESD
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
DD
and V
DD
pins
to induce a functional disturbance
V
DD
=
5V, T
A
=
+25°C, f
OSC
=
8MHz
conforms to IEC 1000-4-2
1
0.7
kV
V
FFTB
V
DD
=
5V, T
A
=
+25°C, f
OSC
=
8MHz
conforms to IEC 1000-4-4
2
2
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