参数资料
型号: ST93C06C
厂商: 意法半导体
英文描述: 256 bit 16 x 16 or 32 x 8 SERIAL MICROWIRE EEPROM
中文描述: 256位16 × 16或32 × 8 MICROWIRE的串行EEPROM的
文件页数: 8/15页
文件大小: 118K
代理商: ST93C06C
The data contained at this address is then clocked
out serially. The address pointer is automatically
incremented after the data is output and, if the Chip
Select input (S) is held High, the ST93C06 can
output a sequential stream of data bytes/words. In
this way, the memory can be read as a data stream
from 8 to 256 bits long, or continuously as the
address counter automatically rolls over to ’00’
when the highest address is reached. Program-
ming is internally self-timed (the external clock
signal on C input may be disconnected or left
running after the start of a Write cycle) and does
not require an erase cycle prior to the Write instruc-
tion. The Write instruction writes 8 or 16 bits at one
time into one of the 32 bytes or 16 words. After the
start of the programming cycle aBusy/Ready signal
is available on the Data output (Q) when Chip
Select (S) is driven High.
The design of the ST93C06 and the High Endur-
ance CMOS technologyused for its fabrication give
an Erase/Write cycle Endurance of 1,000,000 cy-
cles and a data retention of 40 years.
VSS
Q
ORG
DU
C
SVCC
D
AI00817B
ST93C06
ST93C06C
1
2
3
4
8
7
6
5
Figure 2A. DIP Pin Connections
1
VSS
Q
ORG
DU
C
SVCC
D
AI00818C
ST93C06
ST93C06C
2
3
4
8
7
6
5
Figure 2B. SO Pin Connections
DESCRIPTION (cont’d)
Warning: DU = Don’t Use
Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature
–40 to 125
°C
TSTG
Storage Temperature
–65 to 150
°C
TLEAD
Lead Temperature, Soldering
(SO8 package)
(PSDIP8 package)
40 sec
10 sec
215
260
°C
VIO
Input or Output Voltages (Q = VOH or Hi-Z)
–0.3 to VCC +0.5
V
VCC
Supply Voltage
–0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model)
(2)
ST93C06
ST93C06C
2000
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
ST93C06
ST93C06C
500
V
Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the SGS-THOMSON SURE Program and other
relevant quality documents.
2. MIL-STD-883C, 3015.7 (100pF, 1500
).
3. EIAJ IC-121 (Condition C) (200pF, 0
).
Table 2. Absolute Maximum Ratings (1)
2/15
ST93C06, ST93C06C
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