参数资料
型号: STM32L151C8U6TR
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 32 MHz, RISC MICROCONTROLLER, QCC48
封装: 7 X 7 MM, 0.50 MM PITCH, ROHS COMPLIANT, VFQFPN-48
文件页数: 75/106页
文件大小: 1417K
代理商: STM32L151C8U6TR
Electrical characteristics
STM32L151xx, STM32L152xx
Doc ID 17659 Rev 1
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
6.3.10
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 34.
EMI characteristics
Symbol Parameter
Conditions
Monitored
frequency band
Max vs. voltage range
Unit
4 MHz
16 MHz 32 MHz
SEMI
Peak level
VDD = 3.3 V,
TA = 25 °C,
LQFP100 package
compliant with IEC
61967-2
0.1 to 30 MHz
TBD
dBV
30 to 130 MHz
TBD
130 MHz to 1GHz
TBD
SAE EMI Level
TBD
-
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