参数资料
型号: TA1204AF
元件分类: 消费家电
英文描述: SPECIALTY CONSUMER CIRCUIT, PQFP44
封装: 14 X 14 MM, 0.80 MM PITCH, PLASTIC, QFP-44
文件页数: 7/25页
文件大小: 575K
代理商: TA1204AF
TA1204AF
2001-02-07 15/25
Note 11:
Minimum range of cut-off adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
VR25 : Min (pin 25←5V)
Change SW25 from OFF to ON, and adjust VR25 fully until 5V can be applied to pin 25.
Input a signal (0.7Vp-p) including black and white levels to input A (X In1).
Measure the voltage difference between the γ0 level of the positive output and that of the negative
output in an output pin (pin 21 when X = B, pin 19 when X = G, and pin 14 when X = R).
Repeat this measurement replacing B, G, and R as the X-axis.
Note 12:
Maximum cut-off fine adjustment range value, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1 (X = B or R)
Test signal 3
X = B : VR26 : Min / Max (pin 26←0V / 5V)
X = R : VR24 : Min / Max (pin 24←0V / 5V)
When measuring channel B (X = B), change SW26 from OFF to ON, and input a signal (0.7Vp-p)
including black and white levels in input A (B In1). Turn VR26 clockwise and anticlockwise and
measure the maximum value (when pin 26 = 5V and pin 26 = 0V) of the voltage difference from the
γ0 levels of the positive and negative polarity outputs of an output pin (pin 21). Obtain the voltage
difference from the No. 15 standard cut-off level of each voltage.
For channel R (X = R), change SW24 from OFF to ON, turn VR24 clockwise and anticlockwise, and
make the same measurement as for channel B with output pin (14) using R In1 as the input pin.
Note 13:
Maximum value of drive output amplitude adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
VR29 : →Max
Change SW25 from a to b, and adjust VR25 until 0V is applied to pin 25. Input a signal (0.7Vp-p)
including black and white levels in input A (X In1). Change SW29 from a to b, raise the voltage
applied to pin 29 by adjusting VR29, and measure the amplitude value when the waveform
amplitude stops increasing from the black to the white level for an output pin (pin 21 when X = B,
pin 19 when X = G, and pin 14 when X = R) for positive and negative polarity outputs.
Note 14:
Minimum value of drive output amplitude adjustment, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1
Test signal 3
VR29 : →Min
Input a signal (0.7Vp-p) including black and white levels in input A (X In1).
Change SW29 from a to b, lower the voltage applied to pin 29 by adjusting VR29, and measure the
amplitude value when the waveform amplitude stops decreasing from the black to the white level at
an output pin (pin 21 when X = B, pin 19 when X = G, and pin 14 when X = R) in positive and
negative polarity outputs.
Note 15:
Maximum and minimum drive fine adjustment values, inter-axis deviation
Test condition 4 (CP mode)
Input :
X In1 (X = B or R)
Test signal 3
X = B : VR28 : Min / Max (pin 28←0V / 5V)
X = R : VR30 : Min / Max (pin 30←0V / 5V)
When measuring channel B, change SW28 from OFF to ON, and input a signal (0.7Vp-p) including
white and black levels in input A (B In1).
Turn VR28 clockwise and anticlockwise and measure the maximum value (when pin 28 = 5V) and
the minimum value (on condition of pin 28 = 0V) of the voltage difference between the black and the
white level of an output pin (pin 21). Obtain the ratio between the black and white levels of the
output pin (pin 19) of each voltage.
When measuring channel P (X = R), change SW30 from OFF to ON, and take the same measurement
as for the channel B for an output pin (pin 14) by turning VR30 clockwise and anticlockwise, with R
In1 as the input pin.
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