参数资料
型号: TE28F008B3T150
厂商: INTEL CORP
元件分类: DRAM
英文描述: SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE
中文描述: 1M X 8 FLASH 3V PROM, 150 ns, PDSO40
封装: 10 X 20 MM, TSOP-40
文件页数: 35/49页
文件大小: 408K
代理商: TE28F008B3T150
E
SMART 3 ADVANCED BOOT BLOCK
–BYTE-WIDE
35
PRELIMINARY
Table 13. DC Characteristics: V
CCQ
= 1.8V
–2.2V
Sym
Parameter
Notes
V
CC1
:
2.7V–2.85V
V
CC2
:
2.7V–3.3V
Unit
Test Conditions
Typ
Max
I
LI
Input Load Current
1
± 1.0
μA
V
CC
= V
CC
Max
V
CCQ
= V
CCQ
Max
V
IN
= V
CCQ
or GND
V
CC
= V
CC
Max
V
CCQ
=
V
CCQ
Max
V
IN
= V
CCQ
or GND
I
LO
Output Leakage Current
1
± 10
μA
I
CCS
V
CC
Standby Current
1,7
20
50
μA
CMOS INPUTS
V
CC
= V
CC1
Max (2.7V–2.85V)
V
CCQ
= V
CCQ
Max
CE# = RP# = V
CCQ
150
250
μ
A
CMOS INPUTS
V
CC
= V
CC2
Max (2.7V–3.3V)
V
CCQ
= V
CCQ
Max
CE# = RP# = V
CCQ
CMOS INPUTS
V
CC
= V
CC
Max (V
CC1
or V
CC2
)
V
CCQ
= V
CCQ
Max
V
IN
= V
CCQ
or GND
RP# = GND ± 0.2V
CMOS INPUTS
V
CC
= V
CC1
Max (2.7V–2.85V)
V
CCQ
= V
CCQ
Max
OE# = V
IH
, CE# = V
IL
f = 5 MHz, I
OUT
= 0 mA
Inputs = V
IL
or V
IH
CMOS INPUTS
V
CC
= V
CC2
Max (2.7V–3.3V)
V
CCQ
= V
CCQ
Max
OE# = V
IH
, CE# = V
IL
f = 5 MHz, I
OUT
= 0 mA
Inputs = GND ± 0.2V or V
CCQ
I
CCD
V
CC
Deep Power-Down
Current
1,7
1
10
μA
I
CCR
V
CC
Read Current
1,5,7
8
18
mA
12
23
mA
相关PDF资料
PDF描述
TE28F016B3B150 SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE
TE28F016B3T120 SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE
TE28F016B3T150 SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE
TEA0652 MONOLITHISCHE STEREO IS
TEA0654 MONOLITHISCHE STEREO IS
相关代理商/技术参数
参数描述
TE28F008B3T90 制造商:INTEL 制造商全称:Intel Corporation 功能描述:SMART 3 ADVANCED BOOT BLOCK 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY
TE28F008B3TA110 制造商:INTEL 制造商全称:Intel Corporation 功能描述:SMART 3 ADVANCED BOOT BLOCK 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY
TE28F008B3TA90 制造商:INTEL 制造商全称:Intel Corporation 功能描述:3 Volt Advanced Boot Block Flash Memory
TE28F008BEB120 制造商:INTEL 制造商全称:Intel Corporation 功能描述:8-MBIT (512K X 16, 1024K X 8) SmartVoltage BOOT BLOCK FLASH MEMORY FAMILY
TE28F008BET120 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Intel 功能描述: