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| 型号： | THS1230IPW |
| 厂商： | Texas Instruments |
| 文件页数： | 10/25页 |
| 文件大小： | 0K |
| 描述： | IC 12 BIT 30 MSPS A/D 28-TSSOP |
| 产品培训模块： | Data Converter Basics |
| 标准包装： | 50 |
| 位数： | 12 |
| 采样率（每秒）： | 30M |
| 数据接口： | 并联 |
| 转换器数目： | 1 |
| 功率耗散（最大）： | 220mW |
| 电压电源： | 模拟和数字 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 28-TSSOP（0.173"，4.40mm 宽） |
| 供应商设备封装： | 28-TSSOP |
| 包装： | 管件 |
| 输入数目和类型： | 1 个差分，单极 |
| 产品目录页面： | 895 (CN2011-ZH PDF) |
| 配用： | 296-10012-ND - EVALUATION MODULE FOR THS1230 |
| 其它名称： | 296-2838-5 |
www.ti.com
Analog Input Bandwidth
Output Timing
Signal-to-Noise Ratio + Distortion (SINAD)
Effective Number of Bits (ENOB)
Total Harmonic Distortion (THD)
Spurious Free Dynamic Range (SFDR)
THS1230
SLAS291B – OCTOBER 2000 – REVISED MARCH 2004
The analog input bandwidth is defined as the maximum frequency of a 1-dBFS input sine wave that can be
applied to the device for which an extra 3-dB attenuation is observed in the reconstructed output signal.
Output timing td(O) is measured from the 50% level of the CLK input falling edge to the 10%/90% level of the
digital output. The digital output load is not higher than 10 pF.
Output hold time th(O) is measured from the 50% level of the CLK input falling edge to the10%/90% level of the
digital output. The digital output load is not less than 2 pF.
Aperture delay td(A) is measured from the 50% level of the CLK input to the actual sampling instant.
The OE signal is asynchronous.
OE timing td(PZ) is measured from the VIH(min) level of OE to the high-impedance state of the output data. The
digital output load is not higher than 10 pF.
OE timing td(EN) is measured from the VIL(max) level of OE to the instant when the output data reaches VOH(min) or
VOL(max) output levels. The digital output load is not higher than 10 pF.
SINAD is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components
below the Nyquist frequency, including harmonics but excluding dc. The value for SINAD is expressed in
decibels.
For a sine wave, SINAD can be expressed in terms of the number of bits. Using the following formula,
N = (SINAD – 1.76)/6.02
it is possible to get a measure of performance expressed as N, the effective number of bits. Thus, effective
number of bits for a device for sine wave inputs at a given input frequency can be calculated directly from its
measured SINAD.
THD is the ratio of the rms sum of the first six harmonic components to the rms value of the measured input
signal and is expressed as a percentage or in decibels.
SFDR is the difference in dB between the rms amplitude of the input signal and the peak spurious signal.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| THS1230IPWG4 | 功能描述:模数转换器 - ADC Low Power High-Speed ADC RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| THS1230IPWR | 功能描述:模数转换器 - ADC Low Power High-Speed ADC RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| THS1230IPWRG4 | 功能描述:模数转换器 - ADC Low Power High-Speed ADC RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| THS124 | 制造商:TOSHIBA 制造商全称:Toshiba Semiconductor 功能描述:HIGH STABILITY MOTOR CONTROL. DIGITAL TACHOMETER. CRANK SHAFT POSITION SENSOR. |
| THS124(TE85R,F) | 制造商:Toshiba 功能描述:Hall Effect Sensor 4-Pin 10-3C1A T/R Cut Tape |
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