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参数资料
| 型号： | TLV5624IDGK |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 3.5 us SETTLING TIME, 8-BIT DAC, PDSO8 |
| 封装： | GREEN, PLASTIC, MSOP-8 |
| 文件页数： | 18/22页 |
| 文件大小： | 571K |
| 代理商： | TLV5624IDGK |
TLV5624
2.7V TO 5.5V LOW POWER 8BIT DIGITALTOANALOG
CONVERTER WITH INTERNAL REFERENCE AND POWER DOWN
SLAS235B JULY 1999 REVISED APRIL 2004
5
WWW.TI.COM
electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
reference pin configured as input (REF)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VI
Input voltage
0
VDD1.5
V
RI
Input resistance
10
M
CI
Input capacitance
5
pF
Reference input bandwidth
REF = 0.2 Vpp + 1.024 V dc
Fast
1.3
MHz
Reference input bandwidth
REF = 0.2 Vpp + 1.024 V dc
Slow
525
kHz
Reference feedthrough
REF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10)
80
dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
digital inputs
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IIH
High-level digital input current
VI = VDD
1
A
IIL
Low-level digital input current
VI = 0 V
1
A
Ci
Input capacitance
8
pF
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ts(FS)
Output settling time, full scale
RL = 10 k,CL = 100 pF,
Fast
1
3
s
ts(FS)
Output settling time, full scale
RL = 10 k,CL = 100 pF,
See Note 11
Slow
3.5
7
s
ts(CC)
Output settling time, code to code
RL = 10 k,CL = 100 pF,
Fast
0.5
1.5
s
ts(CC)
Output settling time, code to code
RL = 10 k,CL = 100 pF,
See Note 12
Slow
1
2
s
SR
Slew rate
RL = 10 k,CL = 100 pF,
Fast
8
V/ s
SR
Slew rate
RL = 10 k,CL = 100 pF,
See Note 13
Slow
1.5
V/
s
Glitch energy
DIN = 0 to 1,
fCLK = 100 kHz,
CS = VDD
5
nVS
SNR
Signal-to-noise ratio
53
57
S/(N+D)
Signal-to-noise + distortion
fs = 480 kSPS, fout = 1 kHz,
48
47
dB
THD
Total harmonic distortion
fs = 480 kSPS, fout = 1 kHz,
RL = 10 k,CL = 100 pF
50
48
dB
Spurious free dynamic range
RL = 10 k ,CL = 100 pF
50
62
NOTES: 11. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFDFand 0xFDF to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within
± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
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| TLV5624IDGKG4 | 功能描述:数模转换器- DAC 8-Bit 1.0-3.5us DAC Serial Out RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
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| TLV5624IDGKRG4 | 功能描述:数模转换器- DAC 8-Bit 1.0-3.5us DAC Serial Out RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
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| TLV5624IDRG4 | 功能描述:数模转换器- DAC 8-Bit 1.0-3.5us DAC Serial Out RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
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