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参数资料
| 型号： | TPS40304DRCR |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 稳压器 |
| 英文描述： | SWITCHING CONTROLLER, 660 kHz SWITCHING FREQ-MAX, PDSO10 |
| 封装： | 3 X 3 MM, GREEN, PLASTIC, SON-10 |
| 文件页数： | 26/31页 |
| 文件大小： | 1798K |
| 代理商： | TPS40304DRCR |
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SLUS964 – NOVEMBER 2009
www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
TJ = –40°C to 125°C, VVDD = 12 V, all parameters at zero power dissipation (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
PGOOD
Feedback upper voltage limit for
VOV
655
675
700
PGOOD
Feedback lower voltage limit for
mV
VUV
500
525
550
PGOOD
VPGD-HYST
PGOOD hysteresis voltage at FB
25
40
RPGD
PGOOD pull down resistance
VFB = 0 V, IFB = 5 mA
30
70
Ω
550 mV < VFB < 655 mV,
IPGDLK
PGOOD leakage current
10
20
A
VPGOOD = 5 V
OUTPUT DRIVERS
RHDHI
High-side driver pull-up resistance
VBOOT – VSW = 5 V, IHDRV = –100 mA
0.8
1.5
2.5
Ω
RHDLO
High-side driver pull-down resistance
VBOOT – VSW = 5 V, IHDRV = 100 mA
0.5
1.0
2.2
Ω
RLDHI
Low-side driver pull-up resistance
ILDRV = -100 mA
0.8
1.5
2.5
Ω
RLDLO
Low-side driver pull-down resistance
ILDRV = 100 mA
0.35
0.60
1.20
Ω
tHRISE
(2)
High-side driver rise time
CLOAD = 5 nF
15
ns
tHFALL
(2)
High-side driver fall time
12
ns
tLRISE
(2)
Low-side driver rise time
15
ns
tLFALL
(2)
Low-side driver fall time
10
ns
OVERCURRENT PROTECTION
tPSSC(min)
(2)
Minimum pulse time during short circuit
250
ns
tBLNKH
(2)
Switch leading-edge blanking pulse time
150
ns
VOCH
OC threshold for high side FET
TJ = 25°C
360
450
580
mV
IOCSET
OCSET current source
TJ = 25°C
9.5
10.0
10.5
A
VLD-CLAMP
Maximum clamp voltage at LDRV
260
340
400
mV
OC comparator offset voltage for low
VOCLOS
TJ = 25°C
–8
8
mV
side FET
Programmable OC range for low side
VOCLPRO
(2)
TJ = 25°C
12
300
mV
FET
OC threshold temperature coefficient
VTHTC
(2)
3000
ppm
(both high side and low side)
tOFF
OC retry cycles on EN/SS pin
4
Cycle
BOOT DIODE
VDFWD
Bootstrap diode forward voltage
IBOOT = 5 mA
0.8
V
THERMAL SHUTDOWN
TJSD
(2)
Junction shutdown temperature
145
°C
TJSDH
(2)
Hysteresis
20
°C
(2)
Ensured by design. Not production tested.
4
Copyright 2009, Texas Instruments Incorporated
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