参数资料
型号: TPS73533DRVT
厂商: Texas Instruments
文件页数: 2/27页
文件大小: 0K
描述: IC REG LDO 3.3V .5A 6-SON
标准包装: 1
稳压器拓扑结构: 正,固定式
输出电压: 3.3V
输入电压: 最高 6.5V
电压 - 压降(标准): 0.28V @ 500mA
稳压器数量: 1
电流 - 输出: 500mA(最小值)
电流 - 限制(最小): 800mA
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 6-WDFN 裸露焊盘
供应商设备封装: 6-SON 裸露焊盘(2x2)
包装: 标准包装
产品目录页面: 1065 (CN2011-ZH PDF)
其它名称: 296-24289-6

TPS735xx
SBVS087K – JUNE 2008 – REVISED AUGUST 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION (1)
PRODUCT
V OUT
(2)
TPS735 xx yyy z
XX is nominal output voltage (for example, 28 = 2.8V, 285 = 2.85V, 01 = Adjustable).
YYY is package designator.
Z is package quantity.
(1)
(2)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com .
Output voltages from 1.0V to 3.6V in 50mV increments are available through the use of innovative factory EEPROM programming;
minimum order quantities may apply. Contact factory for details and availability.
ABSOLUTE MAXIMUM RATINGS
Over operating temperature range (unless otherwise noted). (1)
PARAMETER
V IN range
V EN range
V OUT range
V FB range
TPS735xx
–0.3 to +7.0
–0.3 to V IN +0.3
–0.3 to V IN +0.3
–0.3 to V FB (TYP) +0.3
UNIT
V
V
V
V
Peak output current
Continuous total power dissipation
Internally limited
See Thermal Information table
Junction temperature range, T J
Storage temperature range , T STG
ESD rating, HBM
ESD rating, CDM
–55 to +150
–55 to +150
2
500
°C
°C
kV
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
Copyright ? 2008–2013, Texas Instruments Incorporated
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