参数资料
型号: UPA2731UT1A-E1-AY
厂商: Renesas Electronics America
文件页数: 3/8页
文件大小: 0K
描述: MOSFET P-CH 30V 8-HVSON
标准包装: 3,000
FET 型: MOSFET P 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 30V
电流 - 连续漏极(Id) @ 25° C: 44A
开态Rds(最大)@ Id, Vgs @ 25° C: 3.3 毫欧 @ 22A,10V
Id 时的 Vgs(th)(最大): 2.5V @ 1mA
闸电荷(Qg) @ Vgs: 149nC @ 10V
输入电容 (Ciss) @ Vds: 3620pF @ 10V
功率 - 最大: 1.5W
安装类型: 表面贴装
封装/外壳: 8-HVSON
供应商设备封装: 8-HVSON
包装: 带卷 (TR)

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
μ PA2731UT1A
SWITCHING
P-CHANNEL POWER MOSFET
DESCRIPTION
The μ PA2731UT1A is P-channel MOS Field Effect Transistor designed
for power management applications of notebook computers and Li-ion
PACKAGE DRAWING (Unit: mm)
battery protection circuit.
1
2
8
7
FEATURES
? Low on-state resistance
R DS(on)1 = 3.3 m Ω MAX. (V GS = ? 10 V, I D = ? 22 A)
R DS(on)2 = 6.4 m Ω MAX. (V GS = ? 4.5 V, I D = ? 22 A)
? Low C iss : C iss = 3620 pF TYP.
? Small and surface mount package (8pin HVSON)
3
4
6 ± 0.2
5.4 ± 0.2
6
5
0.10 S
ORDERING INFORMATION
PART NUMBER
PACKAGE
0.2
1
μ PA2731UT1A-E1-AZ
μ PA2731UT1A-E2-AZ
Note
Note
8pin HVSON
8pin HVSON
1, 2, 3 : Source
4 : Gate
5, 6, 7, 8: Drain
Note Pb-free (This product does not contain Pb in external electrode.)
3.65 ± 0.2
ABSOLUTE MAXIMUM RATINGS (T A = 25 ° C, All terminals
are connected.)
0.6 ± 0.15
0.7 ± 0.15
Drain to Source Voltage (V GS = 0 V) V DSS
Gate to Source Voltage (V DS = 0 V) V GSS
? 30 V
m 20 V
EQUIVALENT CIRCUIT
Drain Current (pulse)
I D(pulse)
Total Power Dissipation
P T1
Total Power Dissipation (PW = 10 sec)
P T2
Single Avalanche Current
I AS
Single Avalanche Energy
E AS
Drain Current (DC) I D(DC)
Note1
Note2
Note2
Channel Temperature T ch
Storage Temperature T stg
Note3
Note3
m 44 A
m 180 A
1.5 W
4.6 W
° C
150
? 55 to +150 ° C
? 22 A
48 mJ
Gate
Drain
Source
Body
Diode
Notes 1. PW ≤ 10 μ s, Duty Cycle ≤ 1%
2. Mounted on a glass epoxy board (25.4 mm x 25.4 mm x 0.8 mm)
3. Starting T ch = 25 ° C, V DD = ? 15 V, R G = 25 Ω , L = 100 μ H, V GS = ? 20 → 0 V
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade
the device operation. Steps must be taken to stop generation of static electricity as much as possible, and
quickly dissipate it once, when it has occurred.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. G17640EJ1V0DS00 (1st edition)
Date Published January 2006 NS CP(K)
Printed in Japan
2005
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