参数资料
| 型号： | USB2SERA10CFK |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 6/28页 |
| 文件大小： | 0K |
| 描述： | USB TO SERIAL BRIDGE |
| 标准包装： | 490 |
| 特点： | USB 至 UART |
| 通道数： | 1，UART |
| FIFO's： | 512 字节 |
| 规程： | RS232，RS485，USB 2.0 |
| 电源电压： | 2.7 V ~ 5.5 V |
| 带自动流量控制功能： | 是 |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 24-VQFN 裸露焊盘 |
| 供应商设备封装： | 24-QFN 裸露焊盘（5x5） |
| 包装： | 托盘 |
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USB2SERA10 Data Sheet, Rev. 2
Electrical Characteristics
Freescale Semiconductor
14
Appendix A Electrical Characteristics
This chapter contains electrical and timing specifications.
A.1
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding, the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The above classifications are used in the column labeled C in applicable tables of this data
sheet.
A.2
Absolute Maximum Ratings
Absolute maximum ratings are only stress ratings. Functional operation at maximum is not guaranteed. Stress beyond the limits
specified in Table A-2 may affect the device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields. However, it is advised
that normal precautions be taken to avoid application of any voltages higher than the maximum-rated voltages to this high-
impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either VSS or VDD).
1. Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate
resistance values for positive (VDD) and negative (VSS) clamp voltages, then use the larger of the two resistance values.
2. All functional non-supply pins are internally clamped to VSS and VDD.
Table A-1. Parameter classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from
typical devices under typical conditions unless otherwise noted. All values shown in the
typical column are within this category.
D Those parameters are derived mainly from simulations.
Table A-2. Absolute maximum ratings
Rating
Symbol
Value
Unit
Supply voltage
VDD
2.7 to 5.5
V
Input voltage
Vin
–0.3 to V
DD + 0.3
V
Instantaneous maximum current Single pin
limit (applies to all port pins)1, 2, 3
I
D
± 25
mA
Maximum current into VDD
I
DD 120
mA
Storage temperature
Tstg
–55 to 150
C
Maximum junction temperature
T
J
150
C
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