参数资料
型号: WJLXT908LC.A4
厂商: CORTINA SYSTEMS INC
元件分类: 网络接口
英文描述: DATACOM, ETHERNET TRANSCEIVER, PQFP64
封装: ROHS COMPLIANT, LQFP-64
文件页数: 20/46页
文件大小: 618K
代理商: WJLXT908LC.A4
Intel
LXT908 Universal 3.3 V 10BASE-T and AUI Transceiver
Datasheet
27
Document #: 249049
Revision #: 003
Rev. Date: 29-Oct-2005
4.0
Test Specifications
Note:
represent the performance specifications of the Intel LXT908 Universal 3.3 V 10BASE-T and
AUI Transceiver. These specifications are guaranteed by test except where noted “by design.”
Minimum and maximum values listed in Table 6 through Table 13 on page 30 apply over the
recommended operating conditions specified in Table 5.
For all Quality and Reliability issues (for example, parts packaging and thermal specifications),
please send your questions to Intel at the following e-mail address: www.qr.requests@intel.com.
.
Table 4.
Absolute Maximum Values
Parameter
Symbol
Min
Max
Units
Supply voltage
VCC
-0.3
6
V
Storage temperature
TSTG
-65
+150
C
Caution:
Exceeding these values may cause permanent damage. Functional operation
under these conditions is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.
Table 5.
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Recommended supply voltage1
VCC
3.13
3.3
3.47
V
Recommended operating temperature (Commercial)
TOP
0–
+70
C
Recommended operating temperature (Extended)
TOP
-40
+85
C
1. Voltages with respect to ground unless otherwise specified.
Table 6.
I/O Electrical Characteristics
Parameter
Sym
Min
Typ
1
Max
Units
Test Conditions
Input Low voltage2
VIL
––
0.8
V
Input High voltage2
VIH
2.0
V
Output Low voltage
VOL
––
0.4
V
IOL = 1.6 mA
VOL
––
10
%VCC
IOL < 10 A
Output Low voltage
(Open drain LED driver)
VOLL
––
0.7
V
IOLL = 10 mA
Output High voltage
VOH
2.4
V
IOH = 40 A
VOH
90
%VCC
IOH < 10 A
Output rise time
TCLK & RCLK
CMOS
3
12
ns
CLOAD = 20 pF
TTL
2
8
ns
1. Typical values are at 25°C and are for design aid only, are not guaranteed, and are not subject to
production testing.
2. Limited functional tests are performed at these input levels. The majority of functional tests are performed
at levels of 0V and 3V.
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