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| 型号： | 05041A181JHT6A |
| 厂商： | AVX Corporation |
| 文件页数： | 26/115页 |
| 文件大小： | 0K |
| 描述： | CAP CER 180PF 100V 5% NP0 0504 |
| 产品培训模块： | Component Solutions for Smart Meter Applications |
| 标准包装： | 418 |
| 电容： | 180pF |
| 电压 - 额定： | 100V |
| 容差： | ±5% |
| 温度系数： | C0G，NP0 |
| 安装类型： | 表面贴装，MLCC |
| 工作温度： | -55°C ~ 125°C |
| 应用： | 旁通，去耦 |
| 封装/外壳： | 0504（1210 公制） |
| 尺寸/尺寸： | 0.050" L x 0.040" W（1.27mm x 1.02mm） |
| 厚度（最大）： | 0.040"（1.02mm） |
| 包装： | 托盘 - 晶粒 |
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X5R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
Insulation Resistance
Dielectric Strength
Appearance
X5R Specification Limits
-55oC to +85oC
Within specified tolerance
≤ 2.5% for ≥ 50V DC rating
≤ 3.0% for 25V DC rating
≤ 12.5% Max. for 16V DC rating and lower
Contact Factory for DF by PN
10,000MΩ or 500MΩ - μF,
whichever is less
No breakdown or visual defects
No defects
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10 μF, 0.5Vrms @ 120Hz
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Deflection: 2mm
Resistance to
Flexure
Stresses
Capacitance
Variation
Dissipation
Factor
≤ ±12%
Meets Initial Values (As Above)
Test Time: 30 seconds
1mm/sec
Insulation
Resistance
Solderability
Appearance
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
90 mm
Dip device in eutectic solder at 230 ± 5oC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Dip device in eutectic solder at 260oC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Appearance
Capacitance
Variation
No visual defects
≤ ±7.5%
Step 1: -55oC ± 2o
Step 2: Room Temp
30 ± 3 minutes
≤ 3 minutes
Thermal
Shock
Dissipation
Factor
Insulation
Resistance
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +85oC ± 2o
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
Dielectric
Strength
Appearance
Capacitance
Variation
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5X rated voltage in
test chamber set at 85oC ± 2oC for 1000 hours
(+48, -0). Note: Contact factory for *optional
Load Life
Load
Humidity
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
specification part numbers that are tested at
< 1.5X rated voltage.
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85oC ± 2oC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
25
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