参数资料
型号: 2SC5616-EB
元件分类: 小信号晶体管
英文描述: L BAND, Si, NPN, RF SMALL SIGNAL TRANSISTOR
封装: MINIMOLD PACKAGE-3
文件页数: 5/10页
文件大小: 126K
代理商: 2SC5616-EB
Data Sheet D12355EJ3V0DS
2
2SK2981
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Drain to Source On-state Resistance
RDS(on)1
VGS = 10 V, ID = 10 A
20
27
m
RDS(on)2
VGS = 4.5 V, ID = 10 A
30
40
m
RDS(on)3
VGS = 4 V, ID = 10 A
35
50
m
Gate to Source Cut-off Voltage
VGS(off)
VDS = 10 V, ID = 1 mA
1.0
1.5
2.0
V
Forward Transfer Admittance
| yfs |VDS = 10 V, ID = 10 A
6.0
13.0
S
Drain Leakage Current
IDSS
VDS = 30 V, VGS = 0 V
10
A
Gate to Source Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±10
A
Input Capacitance
Ciss
VDS = 10 V, VGS = 0 V, f = 1 MHz
860
pF
Output Capacitance
Coss
350
pF
Reverse Transfer Capacitance
Crss
160
pF
Turn-on Delay Time
td(on)
ID = 10 A, VGS(on) = 10 V, VDD = 15 V
25
ns
Rise Time
tr
RG = 10
270
ns
Turn-off Delay Time
td(off)
65
ns
Fall Time
tf
65
ns
Total Gate Charge
QG
ID = 20 A, VDD = 24 V, VGS = 10 V
20
nC
Gate to Source Charge
QGS
3.5
nC
Gate to Drain Charge
QGD
6.5
nC
Body Diode forward Voltage
VF(S-D)
IF = 20 A, VGS = 0 V
0.8
V
Reverse Recovery Time
trr
IF = 20 A, VGS = 0 V
35
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/
s30
nC
TEST CIRCUIT 2 GATE CHARGE
TEST CIRCUIT 1 SWITCHING TIME
PG.
RG
0
VGS
D.U.T.
RL
VDD
τ = 1 s
Duty Cycle
≤ 1 %
VGS
Wave Form
ID
Wave Form
VGS
10 %
90 %
VGS(on)
10 %
0
ID
90 %
td(on)
tr
td(off)
tf
10 %
τ
ID
0
ton
toff
PG.
50
D.U.T.
RL
VDD
IG = 2 mA
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