4463-TCE30E915S-EK (Silicon) PDF资料下载 Datasheet(4/56 页)

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参数资料

型号：	4463-TCE30E915S-EK
厂商：	Silicon Laboratories Inc
文件页数：	4/56页
文件大小：	0K
描述：	KIT EZRADIO TEST CARD SI4463 TX
标准包装：	1
系列：	EZRadioPRO®
类型：	收发器，ISM
频率：	915MHz
适用于相关产品：	Si4463
已供物品：	板

Si4464/63/61/60

1. Electrical Specifications

Table 1. DC Characteristics 1

Parameter

Supply Voltage

Symbol

V DD

Test Condition

Min

1.8

Typ

3.3

Max

3.6

Unit

V

Range

Power Saving Modes I Shutdown

RC Oscillator, Main Digital Regulator,

—

30

—

nA

and Low Power Digital Regulator OFF

I Standby

Register values maintained and RC

—

50

—

nA

oscillator/WUT OFF

I SleepRC

RC Oscillator/WUT ON and all register values main-

—

900

—

nA

tained, and all other blocks OFF

I SleepXO

I Sensor

Sleep current using an external 32 kHz crystal. 2

Low battery detector ON, register values maintained,

—

—

1.7

1

—

—

μA

μA

-LBD

and all other blocks OFF

I Ready

Crystal Oscillator and Main Digital Regulator ON,

—

1.8

—

mA

all other blocks OFF

TUNE Mode Current

RX Mode Current

I Tune_RX

I Tune_TX

I RXH

RX Tune, High Performance Mode

TX Tune, High Performance Mode

High Performance Mode

—

—

—

7.2

8

13.7

—

—

—

mA

mA

mA

I RXL

Low Power

Mode 2

—

10.7

—

mA

TX Mode Current

I TX_+20

+20 dBm output power, class-E match, 915 MHz,

—

85

—

mA

(Si4464/63)

3.3 V

+20 dBm output power, class-E match, 460 MHz,

—

75

—

mA

3.3 V

+20 dBm output power, square-wave match,

—

70

—

mA

169 MHz, 3.3 V

TX Mode Current

(Si4461)

TX Mode Current

(Si4460)

I TX_+16

I TX_+14

I TX_+13

I TX_+10

+16 dBm output power, class-E match, 868 MHz,

3.3 V 2

+14 dBm output power, Switched-current match,

868 MHz, 3.3 V 2

+13 dBm output power, switched-current match,

868 MHz, 3.3 V 2

+10 dBm output power, Class-E match, 868 MHz,

3.3 V 2

—

—

—

—

43

37

29

18

—

—

—

—

mA

mA

mA

mA

Notes:

1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are

listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 14.

2. Guaranteed by qualification. Qualification test conditions are listed in the “Qualification Test Conditions” section in "1.1.

Definition of Test Conditions" on page 14.

4

Rev 1.2

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